Towards the preparation of optical surfaces preserving the coherence and hard x-ray beams

Proceedings of SPIE - The International Society for Optical Engineering

Volumn 4501, Issue , 2001, Pages 43-53

  Hignette, Olivier ^a   Peffen, Jean Christophe ^a   Alvaro, Virginie ^a   Chinchio, Elia ^a   Freund, Anderas K ^a  

^a EUROPEAN SYNCHROTRON RADIATION FACILITY   (France)

Author keywords

Coherence; Ion beam milling; Metrology; X ray mirrors and multilayers

Indexed keywords

FOCUSING; ION BEAMS; MIRRORS; MULTILAYERS; OPTICAL VARIABLES MEASUREMENT; STABILITY; SURFACES; SYNCHROTRON RADIATION; SYNCHROTRONS; WAVEFRONTS; X RAY SCATTERING;

COHERENCE PROPERTIES; GRAZING INCIDENCE MIRRORS; ION BEAM MILLING MACHINES; OPTICAL SURFACES; SURFACE QUALITY; SYNCHROTRON X RAY SCATTERING TECHNIQUES; X RAY BEAMS; X RAY POSITION SENSITIVE DETECTORS;

X RAY OPTICS;

EID: 0035772886     PISSN: 0277786X     EISSN: None     Source Type: Journal    
DOI: 10.1117/12.448497     Document Type: Article

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