-
1
-
-
51349133283
-
Microwave characterisation of la- and dy- doped bifeo3 thin films. 6th
-
ISAF, 27-31 May
-
H.I.Chien, P.Kr. Petrov, V.R. Palkar,A.K.Tagantsev,K. Prashanthi, A.K. Axelsson, S. Bhattacharya, N.M. Alford, Microwave characterisation of La- and Dy- doped BiFeO3 thin films. 6th IEEE international symposium on applications of ferroelectrics, ISAF, 27-31 May 2007, pp. 380-382
-
(2007)
IEEE International Symposium on Applications of Ferroelectrics
, pp. 380-382
-
-
Chien, H.I.1
Petrov, P.Kr.2
Palkar, V.R.3
Tagantsev, A.K.4
Prashanthi, K.5
Axelsson, A.K.6
Bhattacharya, S.7
Alford, N.M.8
-
2
-
-
33646895966
-
Complex permittivity measurements of thin ferroelectric films employing split post dielectric resonator
-
Foz do Iguacu, Brazil, 5-9 Sept
-
J. Krupka, W.T. Huang, M.J. Tung, Complex permittivity measurements of thin ferroelectric films employing split post dielectric resonator. 11th international meeting on ferroelectricity, Foz do Iguacu, Brazil, 5-9 Sept 2005
-
(2005)
11th International Meeting on Ferroelectricity
-
-
Krupka, J.1
Huang, W.T.2
Tung, M.J.3
-
5
-
-
33846210961
-
Paraelectric thin films by nanoscale engineering of epitaxy and planar anisotropy for microwave phase shifter applications
-
E.K. Akdogan, W.K. Simon, A. Safari, Paraelectric thin films by nanoscale engineering of epitaxy and planar anisotropy for microwave phase shifter applications. IEEE Trans. Ultrason. Ferroelectr. Freq. Control 53(12), 2323-2332 (2006)
-
(2006)
IEEE Trans. Ultrason. Ferroelectr. Freq. Control
, vol.53
, Issue.12
, pp. 2323-2332
-
-
Akdogan, E.K.1
Simon, W.K.2
Safari, A.3
-
6
-
-
33847698600
-
Comparison of techniques for microwave characterization of bst thin films
-
P.M. Suherman, T.J. Jackson, M.l.J. Lancaster, Comparison of techniques for microwave characterization of BST thin films. IEEE Trans. Microw. Theory Tech. 55(2), 397-401 (2007)
-
(2007)
IEEE Trans. Microw. Theory Tech.
, vol.55
, Issue.2
, pp. 397-401
-
-
Suherman, P.M.1
Jackson, T.J.2
Lancaster, M.L.J.3
-
7
-
-
0032099110
-
Microwave properties of sr0.5ba0.5tio3 thin-film interdigitated capacitors
-
S.W. Kirchoefer, J.M. Pond, A.C. Carter, W. Chang, K.K. Agarwal, J.S. Horwitz, D.B. Chrisey, Microwave properties of Sr0.5Ba0.5TiO3 thin-film interdigitated capacitors. Microw. Opt. Technol. Lett. 18(3), 168-171 (1998)
-
(1998)
Microw. Opt. Technol. Lett.
, vol.18
, Issue.3
, pp. 168-171
-
-
Kirchoefer, S.W.1
Pond, J.M.2
Carter, A.C.3
Chang, W.4
Agarwal, K.K.5
Horwitz, J.S.6
Chrisey, D.B.7
-
8
-
-
34547155591
-
Microwave dielectric properties of strained ba0.5sr0.5tio3 films with and without strain-induced permanent polarization at room temperature
-
W. Chang, L.M.B. Alldredge, S.W. Kirchoefer, J.M. Pond, Microwave dielectric properties of strained Ba0.5Sr0.5TiO3 films with and without strain-induced permanent polarization at room temperature. J. Appl. Phys. 102, 014105 (2007)
-
(2007)
J. Appl. Phys.
, vol.102
, pp. 014105
-
-
Chang, W.1
Alldredge, L.M.B.2
Kirchoefer, S.W.3
Pond, J.M.4
-
9
-
-
34547291286
-
Multifunctional ferrimagnetic-ferroelectric thin films for microwave applications
-
R. Heindl, H. Srikanth, S. Witanachchi, P. Mukherjee, A. Heim, G. Matthews, S. Balachandran, S. Natarajan, T. Weller, Multifunctional ferrimagnetic-ferroelectric thin films for microwave applications. Appl. Phys. Lett. 90, 252507 (2007)
-
(2007)
Appl. Phys. Lett.
, vol.90
, pp. 252507
-
-
Heindl, R.1
Srikanth, H.2
Witanachchi, S.3
Mukherjee, P.4
Heim, A.5
Matthews, G.6
Balachandran, S.7
Natarajan, S.8
Weller, T.9
-
10
-
-
0030164119
-
Cad models for multilayered substrate interdigital capacitors
-
S.S. Gevorgian, T. Martinsson, P.L.J. Linnkr, E.L. Kollberg, CAD models for multilayered substrate interdigital capacitors. IEEE Trans. Microw. Theory Tech. 44(6), 896-904 (1996)
-
(1996)
IEEE Trans. Microw. Theory Tech.
, vol.44
, Issue.6
, pp. 896-904
-
-
Gevorgian, S.S.1
Martinsson, T.2
Linnkr, P.L.J.3
Kollberg, E.L.4
-
11
-
-
33747335140
-
Ferroelectric properties of pbxsr1-xtio3 and its compositionally graded thin films grown on the highly oriented lanio3 buffered pt/ti/sio2/si substrates
-
J. Zhaia, X. Yao, Z. Xu, H. Chen, Ferroelectric properties of PbxSr1-xTiO3 and its compositionally graded thin films grown on the highly oriented LaNiO3 buffered Pt/Ti/SiO2/Si substrates. J. Appl. Phys. 100, 034108 (2006)
-
(2006)
J. Appl. Phys.
, vol.100
, pp. 034108
-
-
Zhaia, J.1
Yao, X.2
Xu, Z.3
Chen, H.4
-
12
-
-
0001228144
-
Improved low frequency and microwave dielectric response in strontium titanate thin films grown by pulsed laser ablation
-
M.J. Dalberth, R.E. Stauber, J.C. Price, C.T. Rogers, D. Galt, Improved low frequency and microwave dielectric response in strontium titanate thin films grown by pulsed laser ablation. Appl. Phys. Lett. 72(4), 507-509 (1998)
-
(1998)
Appl. Phys. Lett.
, vol.72
, Issue.4
, pp. 507-509
-
-
Dalberth, M.J.1
Stauber, R.E.2
Price, J.C.3
Rogers, C.T.4
Galt, D.5
-
13
-
-
0035395955
-
Concentration dependence of the dielectric constant in mixed oxides mxoympoq
-
R.A.B. Devine, A.G. Revesz, Concentration dependence of the dielectric constant in mixed oxides MxOyMpOq. J. Appl. Phys. 90(11), 389-393 (2001)
-
(2001)
J. Appl. Phys.
, vol.90
, Issue.11
, pp. 389-393
-
-
Devine, R.A.B.1
Revesz, A.G.2
-
14
-
-
38149012994
-
Dielectric and microwave properties of ba(sn0.15ti0.85)o3 thin films
-
S.N. Song, J.W. Zhai, X. Yao, Dielectric and microwave properties of Ba(Sn0.15Ti0.85)O3 thin films. Mater. Lett. 62, 1173-1175 (2008)
-
(2008)
Mater. Lett.
, vol.62
, pp. 1173-1175
-
-
Song, S.N.1
Zhai, J.W.2
Yao, X.3
-
15
-
-
0030258222
-
Lower order modes of ybco/sto/ybco circular disk resonators
-
S. Gevorgian, E. Carlsson, P. Linnkr, E. Kollberg, O. Vendik, E. Wikborg, Lower order modes of YBCO/STO/YBCO circular disk resonators. IEEE Trans. Microw. Theory Tech. 44(10), 1738-1741 (1996)
-
(1996)
IEEE Trans. Microw. Theory Tech.
, vol.44
, Issue.10
, pp. 1738-1741
-
-
Gevorgian, S.1
Carlsson, E.2
Linnkr, P.3
Kollberg, E.4
Vendik, O.5
Wikborg, E.6
-
16
-
-
47049100100
-
Microstructure and dielectric response of srtio3/ndgao3 interdigitated capacitors
-
S.K. Hodak, C.T. Rogers, Microstructure and dielectric response of SrTiO3/NdGaO3 interdigitated capacitors. Microelectron. Eng. 85, 444-451 (2008)
-
(2008)
Microelectron. Eng.
, vol.85
, pp. 444-451
-
-
Hodak, S.K.1
Rogers, C.T.2
-
17
-
-
51249125245
-
Properties of nixzn(1-x)fe2o4 thick films at microwave frequencies
-
D.C. Kulkarni, S.P. Patil, V. Puri, Properties of NixZn(1-x)Fe2O4 thick films at microwave frequencies. Microelectron. J. 39, 248-252 (2008)
-
(2008)
Microelectron. J.
, vol.39
, pp. 248-252
-
-
Kulkarni, D.C.1
Patil, S.P.2
Puri, V.3
-
18
-
-
0029326353
-
Ferroelectric thin film characterization using superconducting microstrip resonators
-
D. Galt, J.C. Price, J.A. Beall, T.E. Harvey, Ferroelectric thin film characterization using superconducting microstrip resonators. IEEE Trans. Appl. Supercond. 5(2), 2575-2578 (1995)
-
(1995)
IEEE Trans. Appl. Supercond.
, vol.5
, Issue.2
, pp. 2575-2578
-
-
Galt, D.1
Price, J.C.2
Beall, J.A.3
Harvey, T.E.4
-
19
-
-
34347347162
-
Microwave performance of thin film ferroelectric varactors in the wide temperature range of -223°c to ?227°c. J
-
A. Vorobiev, S. Gevorgian, Microwave performance of thin film ferroelectric varactors in the wide temperature range of -223°C to ?227°C. J. Eur. Ceram. Soc. 27, 3847-3850 (2007)
-
(2007)
Eur. Ceram. Soc.
, vol.27
, pp. 3847-3850
-
-
Vorobiev, A.1
Gevorgian, S.2
-
20
-
-
33750617935
-
Study of thick film ni(1-x)coxmn2o4 (0 b x b1) using overlay technique on thick film microstrip ring resonator
-
S.A. Kanadea, V. Puri, Study of thick film Ni(1-x)CoxMn2O4, (0 B x B1) using overlay technique on thick film microstrip ring resonator. Microelectron. J. 37, 1302-1305 (2006)
-
(2006)
Microelectron. J.
, vol.37
, pp. 1302-1305
-
-
Kanadea, S.A.1
Puri, V.2
-
21
-
-
33846459231
-
Dielectric measurements on substrates materials at microwave frequencies using a cavity perturbation technique
-
D.C. Dube, M.T. Lanagan, J.H. Kim, S.J. Jang, Dielectric measurements on substrates materials at microwave frequencies using a cavity perturbation technique. J. Appl. Phys. 63(7), 2466-2468 (1988)
-
(1988)
J. Appl. Phys.
, vol.63
, Issue.7
, pp. 2466-2468
-
-
Dube, D.C.1
Lanagan, M.T.2
Kim, J.H.3
Jang, S.J.4
-
22
-
-
13444267608
-
Study of microwave dielectric properties measurements by various resonance techniques
-
J. Sheen, Study of microwave dielectric properties measurements by various resonance techniques. Measurement 37, 123-130 (2005)
-
(2005)
Measurement
, vol.37
, pp. 123-130
-
-
Sheen, J.1
-
23
-
-
34547196863
-
Amendment of cavity perturbation technique for loss tangent measurement at microwave frequencies
-
J. Sheen, Amendment of cavity perturbation technique for loss tangent measurement at microwave frequencies. J. Appl. Phys. 102(1), 014102 (2007)
-
(2007)
J. Appl. Phys.
, vol.102
, Issue.1
, pp. 014102
-
-
Sheen, J.1
-
24
-
-
33947588097
-
High temperature dielectric study of cr2o3 in microwave region
-
D.C. Dube, D. Agrawal, S. Agrawal, R. Roy, High temperature dielectric study of Cr2O3 in microwave region. Appl. Phys. Lett. 90, 124105 (2007)
-
(2007)
Appl. Phys. Lett.
, vol.90
, pp. 124105
-
-
Dube, D.C.1
Agrawal, D.2
Agrawal, S.3
Roy, R.4
-
25
-
-
0038007975
-
Microwave permittivity and permeability of ferrite-polymerthick films
-
A. Verma, A.K. Saxena, D.C. Dube, Microwave permittivity and permeability of ferrite-polymerthick films. J. Magn. Magn. Mater. 263, 228-234 (2003)
-
(2003)
J. Magn. Magn. Mater.
, vol.263
, pp. 228-234
-
-
Verma, A.1
Saxena, A.K.2
Dube, D.C.3
-
26
-
-
17944363003
-
Dielectric measurement of ferroelectric sr0.61ba0.39nb2o6 single crystal fiber using cavity perturbation method
-
C. Huang, A.S. Bhalla, M.T. Lanagan, L.E. Cross, R. Guo, Dielectric measurement of ferroelectric Sr0.61Ba0.39Nb2O6 single crystal fiber using cavity perturbation method. Appl. Phys. Lett. 86, 122903 (2005)
-
(2005)
Appl. Phys. Lett.
, vol.86
, pp. 122903
-
-
Huang, C.1
Bhalla, A.S.2
Lanagan, M.T.3
Cross, L.E.4
Guo, R.5
-
27
-
-
14544292431
-
Estimation of complex permittivity of arbitrary shape and size dielectric samples using cavity measurement technique at microwave frequencies
-
M. Santra, K.U. Limaye, Estimation of complex permittivity of arbitrary shape and size dielectric samples using cavity measurement technique at microwave frequencies. IEEE Trans. Microw. Theory Tech. 53, 718-722 (2005)
-
(2005)
IEEE Trans. Microw. Theory Tech.
, vol.53
, pp. 718-722
-
-
Santra, M.1
Limaye, K.U.2
-
28
-
-
0033345519
-
Amendment of cavity perturbation method for permittivity measurement of extremely low-loss dielectrics
-
L.F. Chen, C.K. Ong, B.T.G. Tan, Amendment of cavity perturbation method for permittivity measurement of extremely low-loss dielectrics. IEEE Trans. Instrum. Meas. 48, 1031-1037 (1999)
-
(1999)
IEEE Trans. Instrum. Meas.
, vol.48
, pp. 1031-1037
-
-
Chen, L.F.1
Ong, C.K.2
Tan, B.T.G.3
-
29
-
-
0001343287
-
New approach to the perturbation of cavity resonators by homogeneous, isotropic spheres
-
M.E. Brodwin, M.K. Parsons, New approach to the perturbation of cavity resonators by homogeneous, isotropic spheres. J. Appl. Phys. 36, 494-504 (1965)
-
(1965)
J. Appl. Phys.
, vol.36
, pp. 494-504
-
-
Brodwin, M.E.1
Parsons, M.K.2
-
30
-
-
0027812087
-
Microwave cavity perturbation technique: Part i: Principles
-
O. Klein, S. Donovan, M. Dressel, G. Gruner, Microwave cavity perturbation technique: part I: principles. Int. J. Infrared Millimeter Waves 14, 2423-2457 (1993)
-
(1993)
Int. J. Infrared Millimeter Waves
, vol.14
, pp. 2423-2457
-
-
Klein, O.1
Donovan, S.2
Dressel, M.3
Gruner, G.4
-
31
-
-
0032645835
-
Titanium dioxide (tio2)-based gate insulators
-
S.A. Campbell, H.S. Kim, D.C. Gilmer, B. He, T. Ma, W.L. Gladfelter, Titanium dioxide (TiO2)-based gate insulators. IBM J. Res. Dev. 43, 383-392 (1999)
-
(1999)
IBM J. Res. Dev.
, vol.43
, pp. 383-392
-
-
Campbell, S.A.1
Kim, H.S.2
Gilmer, D.C.3
He, B.4
Ma, T.5
Gladfelter, W.L.6
-
32
-
-
0344193517
-
Rutile-type tio2 thin film for high-k gate insulator
-
M. Kadoshima, M. Hiratani, Y. Shimamoto, K. Torii, H. Miki, S. Kimura, T. Nabatame, Rutile-type TiO2 thin film for high-k gate insulator. Thin Solid Films 424(2), 224-228 (2003)
-
(2003)
Thin Solid Films
, vol.424
, Issue.2
, pp. 224-228
-
-
Kadoshima, M.1
Hiratani, M.2
Shimamoto, Y.3
Torii, K.4
Miki, H.5
Kimura, S.6
Nabatame, T.7
-
33
-
-
0000861643
-
Structural and optical properties of sputtered titania films
-
S.B. Amor, G. Baud, J.P. Besse, M. Jacquet, Structural and optical properties of sputtered Titania films. Mater. Sci. Eng. B 47, 110-118 (1997)
-
(1997)
Mater. Sci. Eng. B
, vol.47
, pp. 110-118
-
-
Amor, S.B.1
Baud, G.2
Besse, J.P.3
Jacquet, M.4
-
34
-
-
36149014791
-
Infrared absorption of reduced rutile tio2 single crystals
-
D.C. Cronemeyer, Infrared absorption of reduced rutile TiO2 single crystals. Phys. Rev. 113, 1222-1226 (1959)
-
(1959)
Phys. Rev.
, vol.113
, pp. 1222-1226
-
-
Cronemeyer, D.C.1
|