Study of thick film Ni(1-x)CoxMn2O4,(0≤x≤1) using overlay technique on thick film microstrip ring resonator

Microelectronics Journal

Volumn 37, Issue 11, 2006, Pages 1302-1305

  Kanade, S A ^a   Puri, Vijaya ^b  

^a RAJARAM COLLEGE   (India)

^b SHIVAJI UNIVERSITY   (India)

Author keywords

Dielectric constant; Microstrip ring resonator; Ni(1 x)CoxMn2O4; Overlay; Thick film

Indexed keywords

MICROELECTRONICS; MICROSTRIP DEVICES; NICKEL ALLOYS; PERMITTIVITY; RESONANCE; RESONATORS;

FREQUENCY SHIFTS; MICROSTRIP RING RESONATORS; OVERLAY; RESONANCE FREQUENCY;

THICK FILMS;

EID: 33750617935     PISSN: 00262692     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.mejo.2006.07.007     Document Type: Article

References (14)

1. Kraszewski A. Microwave aquametry-a review. J. Microwave Power 15 (1980) 209-220
2. Afsar M.N., Birch J.R., and Clark R.N. The measurement of properties of materials. Proc. IEEE 74 (1986) 183-199
3. Aditya S., and Arokiaswami A. Microwave measurement instrumentation, Wiley Encyclopedia of Electrical and Electronics Online (1999), Willey, New York
4. Stuchly S.S., and Bassey C.E. Microwave coplanar sensors for dielectric measurements. Meas. Sci. Technol. 9 (1998) 1324-1329
5. K.C. Gupta, G. Ramesh, I.J. Bhal, Microstripline and Slot Lines, Artech House, Dedham, MA, 1979.
6. Belohoubek E., and Denlinger E. IEEE Trans. Microwave Theory Tech. 20 6 (1975) 522-526
7. Yogi R.A., Gangal S.A., Aiyer R.C., and Karekar R.N. Split modes in asymmetric microstrip ring resonator by flexible perturbation. Microwave Opt. Tech. Lett. 19 (1998) 168-172
8. 2 overlayed λ/2 microstrip rejection filter due to ageing of the overlay. Active Passive Electr. Compon. 21 (1998) 291-305
9. Rane S., and Puri V. Thin film, thick film microstrip band pass filter: a comparison and effect of bulk overlay. Microelectreliability 42 (2002) 1953-1958
10. Rane S., and Puri V. Thick film dielectric overlay effects on thin and thick film microstrip band pass filter. Microelectr. J 32 (2001) 649-654
11. 4 :(0≤x≤1) NTC thermistors. J. Mater. Lett. 60 (2006) 1428-1431
12. Rane S., Amalnekar D., and Puri V. A study on sintering and microstructure development of fritless silver thick film conductors. J. Mater. Sci. Mater. Electr. 11 (2001) 667-674
13. Owens R.P. Accurate analytical determination of quasi-static microstripline parameters. Radio Electron. Eng. 46 (1976) 360-364
14. Joshi K.K., Pollard R.D., and Postoyalko V. Microstrip with dielectric overlay: variational analysis and validation. IEE Proc. Microwave Ant. Prop. 141 (1994) 138-140