Study of microwave dielectric properties measurements by various resonance techniques

Measurement: Journal of the International Measurement Confederation

Volumn 37, Issue 2, 2005, Pages 123-130

  Sheen, Jyh ^a  

^a ORIENTAL INSTITUTE OF TECHNOLOGY   (Taiwan)

Author keywords

Complex permittivity; Dielectric constant; Dielectric loss; Loss tangent; Microwave measurement

Indexed keywords

BESSEL FUNCTIONS; DIELECTRIC LOSSES; FREQUENCIES; PERMITTIVITY; PERTURBATION TECHNIQUES; RESONANCE; WAVEGUIDES;

CAVITY RESONANCE; COMPLEX PERMITTIVITY; LOSS TANGENT; MICROWAVE DIELECTRIC PROPERTIES;

MICROWAVE MEASUREMENT;

EID: 13444267608     PISSN: 02632241     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.measurement.2004.11.006     Document Type: Article

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