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Volumn , Issue , 1991, Pages 580-584
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Improved technique for measuring permittivity of thin dielectrics with a cylindrical resonant cavity
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NONE
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Author keywords
[No Author keywords available]
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Indexed keywords
DIELECTRIC MATERIALS - MEASUREMENTS;
MEASUREMENT ERRORS;
RESONATORS, CAVITY;
CYLINDRICAL RESONANT CAVITY;
LAYERED-DIELECTRIC PERMITTIVITY MEASUREMENT;
RELATIVE PERMITTIVITY;
THIN DIELECTRICS;
MICROWAVE MEASUREMENTS;
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EID: 0026159190
PISSN: None
EISSN: None
Source Type: Conference Proceeding
DOI: None Document Type: Conference Paper |
Times cited : (7)
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References (5)
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