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Volumn , Issue , 2006, Pages 1816-1819

TDR permittivity measurements of dielectric films

Author keywords

Dielectric materials; High frequency measurements; TDR

Indexed keywords

COAXIAL WAVEGUIDE; HIGH FREQUENCY MEASUREMENTS; LUMPED ELEMENT MODEL; TIME-DOMAIN REFLECTOMETRY (TDR);

EID: 36048955735     PISSN: 10915281     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/IMTC.2006.235522     Document Type: Conference Paper
Times cited : (1)

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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.