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Volumn 84, Issue 7, 2011, Pages

Interface of a Bi(001) film on Si(111)-7×7 imaged by surface x-ray diffraction

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Indexed keywords


EID: 80052500478     PISSN: 10980121     EISSN: 1550235X     Source Type: Journal    
DOI: 10.1103/PhysRevB.84.075411     Document Type: Article
Times cited : (27)

References (34)
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