Thin bismuth film as a template for pentacene growth

Applied Physics Letters

Volumn 86, Issue 7, 2005, Pages 1-3

  Sadowski, J T ^a   Nagao, T ^a   Yaginuma, S ^a   Fujikawa, Y ^a   Al Mahboob, A ^a   Nakajima, K ^a   Sakurai, T ^a   Thayer, G E ^b,c   Tromp, R M ^b  

^a TOHOKU UNIVERSITY   (Japan)

^b IBM T J WATSON RESEARCH CENTER   (United States)

^c SANDIA NATIONAL LABORATORIES   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

FULL WIDTH AT HALF MAXIMUM (FWHM); MOLECULAR DENSITY; MOLECULAR FILMS; ULTRAHIGH VACUUM DEPOSITION;

ANNEALING; BISMUTH; CRYSTALLIZATION; DEPOSITION; ELECTRON MICROSCOPES; FILM GROWTH; LOW ENERGY ELECTRON DIFFRACTION; NUCLEATION; SCANNING TUNNELING MICROSCOPY; ULTRAHIGH VACUUM;

THIN FILMS;

EID: 17044427191     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1865350     Document Type: Article

References (17)

1. C. D. Dimitrakopoulos, J. Kymissis, S. Purushothaman, D. A. Neumayer, P. R. Duncombe, and R. B. Laibowitz, Adv. Mater. (Weinheim, Ger.) 11, 1372 (1999).
2. C. D. Dimitrakopoulos, A. R. Brown, and A. Pomp, J. Appl. Phys. 80, 2501 (1996).
3. F.-J. Meyer zu Heringdorf, M. C. Reuter, and R. M. Tromp, Nature (London) 412, 517 (2001).
4. P. G. Schroeder, C. B. France, J. B. Park, and B. A. Parkinson, J. Appl. Phys. 91, 3010 (2002).
5. L. Casalis, M. F. Danisman, B. Nickel, B. Bracco, T. Toccoli, S. Ianotta, and G. Scoles, Phys. Rev. Lett. 90, 206101 (2003).
6. Q. Chen, A. J. McDowall, and N. V. Richardson, Langmuir 19, 10164 (2003).
7. C. D. Dimitrakopoulos, S. Purushothaman, J. Kymissis, A. Callegari, and J. M. Shaw, Science 283, 822 (1999).
8. G. E. Thayer (unpublished).
9. G. Jezequel, J. Thomas, and I. Pollini, Phys. Rev. B 56, 6620 (1997).
10. F. Jona, Surf. Sci. 8, 57 (1967).
11. T. Nagao, J. T. Sadowski, M. Saito, S. Yaginuma, Y. Fujikawa, T. Kogure, T. Ohno, Y. Hasegawa, S. Hasegawa, and T. Sakurai, Phys. Rev. Lett. 93, 105501 (2004).
12. S. Yaginuma, T. Nagao, J. T. Sadowski, A. Pucci, Y. Fujikawa, and T. Sakurai, Surf. Sci. 547, L877 (2003).
13. E. Bauer, Rep. Prog. Phys. 57, 895 (1994).
14. R. M. Tromp, IBM J. Res. Dev. 44, 503 (2000).
15. C. R. Ast and H. Höchst, Phys. Rev. B 67, 113102 (2003).
16. WSxM© http:www.nanotec.es
17. R. B. Campbell, J. M. Robertson, and J. Trotter, Acta Crystallogr. 14, 705 (1961).