Large magnetoresistance of electrodeposited single-crystal bismuth thin films

Science

Volumn 284, Issue 5418, 1999, Pages 1335-1337

  Yang, F Y ^a   Liu, Kai ^a   Hong, Kimin ^a   Reich, D H ^a   Searson, P C ^b   Chien, C L ^a  

^a JOHNS HOPKINS UNIVERSITY   (United States)

^b Johns Hopkins University   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ANNEALING; BISMUTH; ELECTRODEPOSITION; FILM PREPARATION; MAGNETORESISTANCE; SINGLE CRYSTALS;

SHUBNIKOV-DE HAAS OSCILLATIONS;

THIN FILMS;

BISMUTH;

ARTICLE; DRY DEPOSITION; ELECTRON TRANSPORT; FILM; MAGNETIC FIELD; MAGNETISM; OSCILLATION; PRIORITY JOURNAL; TEMPERATURE DEPENDENCE; X RAY DIFFRACTION;

EID: 0033591266     PISSN: 00368075     EISSN: None     Source Type: Journal    
DOI: 10.1126/science.284.5418.1335     Document Type: Article

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16. Supported by NSF grants DMR96-32526 and DMR97-32763.