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Volumn 7, Issue , 2009, Pages 525-528

Study of the interface structure of epitaxial ultra-thin film by an X-ray holographic imaging method

Author keywords

And reflection; Crystal truncation rod; Diffraction; Direct methods; Iron; Phase problem; Silicides; X ray scattering

Indexed keywords

CESIUM COMPOUNDS; DIFFRACTION; HOLOGRAPHY; IRON; SILICIDES; ULTRATHIN FILMS; X RAY SCATTERING;

EID: 70349613844     PISSN: None     EISSN: 13480391     Source Type: Journal    
DOI: 10.1380/ejssnt.2009.525     Document Type: Conference Paper
Times cited : (4)

References (27)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.