Direct structural determination in ultrathin ferroelectric films by analysis of synchrotron x-ray scattering measurements

Physical Review B - Condensed Matter and Materials Physics

Volumn 71, Issue 14, 2005, Pages

  Fong, D D ^a   Cionca, C ^b   Yacoby, Y ^c   Stephenson, G B ^a   Eastman, J A ^a   Fuoss, P H ^a   Streiffer, S K ^a   Thompson, Carol ^d   Clarke, R ^b   Pindak, R ^e   Stern, E A ^f  

^a ARGONNE NATIONAL LABORATORY   (United States)

^b UNIVERSITY OF MICHIGAN   (United States)

^c HEBREW UNIVERSITY OF JERUSALEM   (Israel)

^d NORTHERN ILLINOIS UNIVERSITY   (United States)

^e BROOKHAVEN NATIONAL LABORATORY   (United States)

^f UNIVERSITY OF WASHINGTON   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 28744441822     PISSN: 10980121     EISSN: 1550235X     Source Type: Journal    
DOI: 10.1103/PhysRevB.71.144112     Document Type: Article

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