Study of the surface structure of Si(1 1 1)-6 × 1(3 × 1)-Ag using X-ray crystal truncation rod scattering

Applied Surface Science

Volumn 252, Issue 15, 2006, Pages 5288-5291

  Sumitani, Kazushi ^a   Masuzawa, Kosuke ^a   Hoshino, Takashi ^a   Nakatani, Sinichiro ^a   Takahashi, Toshio ^a   Tajiri, Hiroo ^b   Akimoto, Koichi ^c   Sugiyama, Hiroshi ^d   Zhang, Xiao Wei ^d   Kawata, Hiroshi ^d  

^a UNIVERSITY OF TOKYO   (Japan)

^b JAPAN SYNCHROTRON RADIATION RESEARCH INSTITUTE   (Japan)

^c NAGOYA UNIVERSITY   (Japan)

^d HIGH ENERGY ACCELERATOR RESEARCH ORGANIZATION KEK   (Japan)

Author keywords

Crystal truncation rod; Si(1 1 1) 6 1 Ag; Structure analysis; Surface X ray diffraction

Indexed keywords

MANIPULATORS; SILVER; SURFACE STRUCTURE; X RAY SCATTERING;

CRYSTAL TRUNCATION ROD; SI(1 1 1)-6 × 1-AG; STRUCTURE ANALYSIS; SURFACE X-RAY DIFFRACTION;

SILICON COMPOUNDS;

EID: 33746782107     PISSN: 01694332     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.apsusc.2005.12.054     Document Type: Article

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