Characterization of nanostructures of ZnO and ZnMnO films deposited by successive ionic layer adsorption and reaction method

Thin Solid Films

Volumn 519, Issue 22, 2011, Pages 7638-7643

  Jimenez Garcia F N ^a,b   Espinosa Arbelaez D G ^c,d   Vargas Hernandez C ^b   Del Real, A ^c   Rodriguez Garcia M E ^c  

^a UNIVERSIDAD AUTÓNOMA DE MANIZALES   (Colombia)

^b UNIVERSIDAD NACIONAL DE COLOMBIA   (Colombia)

^c CENTRO DE FÍSICA APLICADA Y TECNOLOGÍA AVANZADA   (Mexico)

^d UNIVERSIDAD NACIONAL AUTÓNOMA DE MÉXICO   (Mexico)

Author keywords

Atomic Force Microscopy; Nanostructured materials; Scanning Electron Microscopy; Surface morphology; Zinc manganese oxide; Zinc oxide

Indexed keywords

AMMONIUM HYDROXIDE; ATOMIC ABSORPTION; ATOMIC FORCE MICROSCOPES; FLOWER-LIKE; GLASS MICROSCOPE SLIDES; HEXAGONAL STRUCTURES; NANO-STRUCTURED; NANOSHEET STRUCTURE; POLYCRYSTALLINE; PRECURSOR SOLUTIONS; SCANNING ELECTRONS; SILAR METHOD; SUCCESSIVE IONIC LAYER ADSORPTION AND REACTIONS; WURTZITES; XRD; XRD PATTERNS; ZNO; ZNO FILMS; ZNO STRUCTURES;

ABSORPTION; ADSORPTION; AMMONIUM COMPOUNDS; ATOMIC FORCE MICROSCOPY; ATOMIC SPECTROSCOPY; BOILING POINT; ENERGY DISPERSIVE SPECTROSCOPY; MANGANESE; MANGANESE OXIDE; METALLIC FILMS; MORPHOLOGY; SCANNING ELECTRON MICROSCOPY; THIN FILMS; X RAY DIFFRACTION; ZINC; ZINC COMPOUNDS; ZINC OXIDE; ZINC SULFIDE;

OXIDE FILMS;

EID: 80052124191     PISSN: 00406090     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.tsf.2011.05.008     Document Type: Article

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