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Volumn 255, Issue 5 PART 1, 2008, Pages 2382-2387
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Growth and characterization of ZnO nanostructured thin films by a two step chemical method
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Author keywords
Nanorods (NRs); SILAR method; Surface morphology; ZnO
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Indexed keywords
FILM PREPARATION;
MORPHOLOGY;
NANORODS;
SCANNING ELECTRON MICROSCOPY;
SUBSTRATES;
SURFACE MORPHOLOGY;
X RAY DIFFRACTION;
ZINC OXIDE;
CHEMICAL-BATH DEPOSITION;
CRYSTAL QUALITIES;
GLASS SUBSTRATES;
HEXAGONAL SHAPES;
KEY INFLUENCING FACTORS;
NANOSTRUCTURED THIN FILM;
SILAR METHOD;
SUCCESSIVE IONIC LAYER ADSORPTION AND REACTIONS;
II-VI SEMICONDUCTORS;
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EID: 56949108659
PISSN: 01694332
EISSN: None
Source Type: Journal
DOI: 10.1016/j.apsusc.2008.07.136 Document Type: Article |
Times cited : (69)
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References (26)
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