Direct measurement of transverse coherence length of hard x rays from interference fringes

Physical Review Letters

Volumn 85, Issue 13, 2000, Pages 2745-2748

  Kohn, V ^a   Snigireva, I ^b   Snigirev, A ^b  

^a KURCHATOV INSTITUTE   (Russian Federation)

^b EUROPEAN SYNCHROTRON RADIATION FACILITY   (France)

Author keywords

[No Author keywords available]

Indexed keywords

COMPUTER SIMULATION; MATHEMATICAL MODELS; WAVE INTERFERENCE; X RAY ANALYSIS;

HARD X-RAYS; TRANSVERSE COHERENCE LENGTH;

INTERFEROMETRY;

EID: 0034714653     PISSN: 00319007     EISSN: 10797114     Source Type: Journal    
DOI: 10.1103/PhysRevLett.85.2745     Document Type: Article

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