Contrast inversion in electrostatic force microscopy imaging of trapped charges: Tip-sample distance and dielectric constant dependence

Nanotechnology

Volumn 22, Issue 34, 2011, Pages

  Riedel, C ^a,b,c   Alegria A ^a,d   Arinero, R ^e   Colmenero, J ^a,b,d   Saenz J J ^b,c  

^a UNIVERSITY OF THE BASQUE COUNTRY UPV EHU   (Spain)

^b DONOSTIA INTERNATIONAL PHYSICS CENTER DIPC   (Spain)

^c INSTITUTO NICOLÁS CABRERA   (Spain)

^d CENTRO MIXTO CSIC UPV EHU   (Spain)

^e UNIVERSITÉ MONTPELLIER II   (France)

Author keywords

[No Author keywords available]

Indexed keywords

ATOMIC FORCE MICROSCOPES; DIFFERENT HEIGHTS; ELECTROSTATIC FORCE MICROSCOPY; EXPERIMENTAL PARAMETERS; FORCE GRADIENTS; GAIN INSIGHT; HETEROGENEOUS DIELECTRICS; INVERSION EFFECTS; SAMPLE THICKNESS; TIP-SAMPLE DISTANCE; TRAPPED CHARGE;

ATOMIC FORCE MICROSCOPY; BEHAVIORAL RESEARCH; ELECTROSTATIC DEVICES; ELECTROSTATIC FORCE;

ELECTRIC FORCE MICROSCOPY;

ARTICLE; ATOMIC FORCE MICROSCOPY; CHEMICAL MODEL; COMPUTER SIMULATION; METHODOLOGY; STATIC ELECTRICITY;

COMPUTER SIMULATION; MICROSCOPY, ATOMIC FORCE; MODELS, CHEMICAL; STATIC ELECTRICITY;

EID: 79961076409     PISSN: 09574484     EISSN: 13616528     Source Type: Journal    
DOI: 10.1088/0957-4484/22/34/345702     Document Type: Article

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