Determination of Young's modulus of carbon nanofiber probes fabricated by the argon ion bombardment of carbon coated silicon cantilever

Carbon

Volumn 49, Issue 13, 2011, Pages 4191-4196

  Inaba, Kazuhisa ^a   Saida, Kouji ^a   Ghosh, Pradip ^a   Matsubara, Ken ^a   Subramanian, Munisamy ^a   Hayashi, Akari ^a   Hayashi, Yasuhiko ^a   Tanemura, Masaki ^a   Kitazawa, Masashi ^b   Ohta, Ryo ^b  

^a NAGOYA INSTITUTE OF TECHNOLOGY   (Japan)

^b OLYMPUS CORPORATION   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

ARGON ION; AXIAL FORCES; BUCKLING BEHAVIORS; ELLIPTICAL CROSS SECTION; EULER'S FORMULA; HIGH QUALITY; LONG AXIS; NANO-CARBON; SCANNING ELECTRON MICROSCOPES; SILICON CANTILEVER; YOUNG'S MODULUS;

AMORPHOUS CARBON; AMORPHOUS SILICON; BUCKLING; CARBON NANOFIBERS; CARBON NANOTUBES; ELASTIC MODULI; ELASTICITY; IONS; NANOCANTILEVERS; PROBES; SCANNING ELECTRON MICROSCOPY;

ION BOMBARDMENT;

EID: 79961022334     PISSN: 00086223     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.carbon.2011.05.051     Document Type: Article

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