Nanoscale mechanics of carbon nanotube evaluated by nanoprobe manipulation in transmission electron microscope

Japanese Journal of Applied Physics, Part 1: Regular Papers and Short Notes and Review Papers

Volumn 45, Issue 1 A, 2006, Pages 364-368

  Kuzumaki, Toru ^a   Mitsuda, Yoshitaka ^a  

^a INSTITUTE OF INDUSTRIAL SCIENCE   (Japan)

Author keywords

Carbon nanotubes; Defects; In situ measurement; Mechanical properties; Nanoprobe manipulation; Transmission electron microscopy

Indexed keywords

BUCKLING; DEFECTS; MECHANICAL PROPERTIES; PLASTIC DEFORMATION; TRANSMISSION ELECTRON MICROSCOPY;

ELESTIC LIMITS; IN SITU MEASUREMENT; NANOPROBE MANIPULATIONS; SI CANTILEVERS;

CARBON NANOTUBES;

EID: 31544470905     PISSN: 00214922     EISSN: 13474065     Source Type: Journal    
DOI: 10.1143/JJAP.45.364     Document Type: Article

References (32)

1. S. J. Tans, A. R. M. Verschueren and C. Dekker: Nature 393 (1998) 49.
2. S. Frank, P. Poncharal, Z. L. Wang and W. A. de Heer: Science 280 (1998) 1744.
3. Z. Yao, H. W. Ch. Postma, L. Balents and C. Dekker: Nature 402 (1999) 273.
4. T. Kuzumaki, K. Miyazawa, H. Ichinose and K. Ito: J. Mater. Res. 13 (1998) 2445.
5. T. Kuzumaki, O. Ujiie, H. Ichinose and K. Ito: Adv. Eng. Mater. 2 (2000) 416.
6. D. Qian, E. C. Dickey, R. Andrews and T. Rantell: Appl. Phys. Lett. 76 (2000) 2868.
7. H. Araki, H. Kaji and K. Yoshino: Jpn. J. Appl. Phys. 38 (1999) L836.
8. H. Araki, D. Kaji and K. Yoshino: Jpn. J. Appl. Phys. 38 (1999) L1351.
9. C. F. Chen, C. L. Lin and C. M. Wang: Jpn. J. Appl. Phys. 41 (2002) L67.
10. J. I. Sohn, C. J. Choi, S. Lee and T. Y. Seong: Jpn. J. Appl. Phys. 41 (2002) 4731.
11. K. Ryu, M. Kang, T. Kim and H. Jeon: Jpn. J. Appl. Phys. 42 (2003) 3578.
12. J. H. Yang, Y. J. Lee, Y. H. Kim, S. H. Moon, B. H. Ha, Y. S. Shin, S. Y. Park, H. S. Kim, C. W. Yang, J. B. Yoo and C. Y. Park: Jpn. J. Appl. Phys. 42 (2003) 6713.
13. Y. Kanazawa, T. Shiroishi, T. Sawada, A. Hosono, S. Nakata and M. Takai: Jpn. J. Appl. Phys. 42 (2003) L1205.
14. T. Ikuno, M. Katayama, N. Yamauchi, W. Wongwriyapan, S. Honda, K. Oura, R. Hobara and S. Hasegawa: Jpn. J. Appl. Phys. 43 (2004) 860.
15. T. Kuzumaki, S. Kitakata, K. Enomoto, T. Yasuhara, N. Ohtake and Y. Mitsuda: Carbon 42 (2004) 2343.
16. E. W. Wong, P. E. Sheehan and C. M. Lieber: Science 277 (1997) 1971.
17. T. W. Tomber, C. Zhou, L. Alexseyev, J. Kong, H. Dai, L. Liu, C. S. Jayanthi, M. Tang and S. Y. Wu: Nature 405 (2000) 769.
18. S. Paulson, M. R. Falvo, N. Snider, A. Helser, T. Hudson, A. Seeger, R. M. Taylor, R. Superfine and S. Washburn: Appl. Phys. Lett. 75 (1999) 2936.
19. M. F. Yu, B. I. Yakobson and R. S. Ruoff: J. Phys. Chem. B 104 (2000) 8764.
20. S. Akita and Y. Nakayama: Jpn. J. Appl. Phys. 42 (2003) 4830.
21. S. Akita and Y. Nakayama: Jpn. J. Appl. Phys. 43 (2004) 3796.
22. T. Kizuka, H. Ohme, T. Sumi, K. Kumazawa, S. Deguchi, M. Naruse, S. Fujisawa, S. Sasaki, A. Yabe and Y. Enomoto: Jpn, J. Appl. Phys. 40 (2001) L170.
23. T. Kuzumaki, H. Sawada, H. Ichinose, Y. Horiike and T. Kizuka: Appl. Phys. Lett. 79 (2001) 4580.
24. T. Kuzumaki and Y. Mitsuda: Appl. Phys. Lett. 85 (2004) 1250.
25. T. Kuzumaki and Y. Mitsuda: Carbon 43 (2005) 2227.
26. T. Kuzumaki, T. Hayashi, K. Miyazawa, H. Ichinose, K. Ito and Y. Ishida: Mater. Trans., JIM 39 (1998) 574.
27. R. F. Roff and D. C. Lorents: Carbon 33 (1995) 925.
28. J. P. Lu: Phys. Rev. Lett. 79 (1997) 1297.
29. T. Kuzumaki, T. Hayashi, H. Ichinose, K. Miyazawa, K. Ito and Y. Ishida: Philos. Mag. A 77 (1998) 1461.
30. Y. Hirai, S. Nishimaki, H. Mori, Y. Kimoto, S. Akita, Y. Nakayama and Y. Tanaka: Jpn. J. Appl. Phys. 42 (2003) 4120.
31. N. Chandra, S. Namilae and C. Shet: Phys. Rev. B 69 (2004) 094101.
32. J. Gaillard, M. Skove and A. M. Rao: Appl. Phys. Lett. 86 (2005) 233109.