Direct growth of single carbon nanofiber onto tip of scanning probe microscopy induced by ion irradiation

Japanese Journal of Applied Physics, Part 1: Regular Papers and Short Notes and Review Papers

Volumn 45, Issue 3 B, 2006, Pages 2004-2008

  Tanemura, Masaki ^a   Kitazawa, Masashi ^b   Tanaka, Junya ^a   Okita, Tatsuhiko ^a   Ohta, Ryo ^b   Miao, Lei ^a   Tanemura, Sakae ^a  

^a NAGOYA INSTITUTE OF TECHNOLOGY   (Japan)

^b OLYMPUS CORPORATION   (Japan)

Author keywords

Carbon nanofiber (CNF); CNF probe; Scanning probe microscope (SPM); Sputtering

Indexed keywords

ATOMIC FORCE MICROSCOPY; CARBON FIBERS; ION BOMBARDMENT; NANOSTRUCTURED MATERIALS; SPUTTERING;

CARBON NANOFIBER (CNF); CNF-PROBE; SCANNING PROBE MICROSCOPE (SPM);

PROBES;

EID: 33645500314     PISSN: 00214922     EISSN: 13474065     Source Type: Journal    
DOI: 10.1143/JJAP.45.2004     Document Type: Article

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