Effective attenuation length dependence on photoelectron kinetic energy for Au from 1 keV to 15 keV

Journal of Electron Spectroscopy and Related Phenomena

Volumn 184, Issue 7, 2011, Pages 384-390

  Rubio Zuazo, J ^a,b   Castro, G R ^a,b  

^a EUROPEAN SYNCHROTRON RADIATION FACILITY   (France)

^b INSTITUTO DE CIENCIA DE MATERIALES DE MADRID   (Spain)

Author keywords

Effective attenuation length; Electron transport; HAXPES; Photoemission

Indexed keywords

BULK MATERIALS; BURIED INTERFACE; CHEMICAL CHARACTERIZATION; CORE LEVELS; DEPTH PROFILE; EFFECTIVE ATTENUATION LENGTH; ELECTRON KINETIC ENERGY; ELECTRON TRANSPORT; EXPERIMENTAL DATA; HARD X-RAY PHOTOELECTRON SPECTROSCOPY; HAXPES; INCIDENT PHOTON ENERGY; PHOTOELECTRON KINETIC ENERGY;

ELECTRON ENERGY LOSS SPECTROSCOPY; ELECTRONS; EMISSION SPECTROSCOPY; INTERFACES (MATERIALS); KINETIC ENERGY; PHOTOELECTRICITY; PHOTOELECTRON SPECTROSCOPY; PHOTONS; X RAY PHOTOELECTRON SPECTROSCOPY;

KINETICS;

EID: 79959817731     PISSN: 03682048     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.elspec.2011.03.006     Document Type: Article

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