A (2 + 3)-Type Surface Diffractometer: Mergence of the z-Axis and (2 + 2)-Type Geometries

Journal of Applied Crystallography

Volumn 31, Issue 2, 1998, Pages 198-203

  Vlieg, Elias ^a,b  

^a FOM INSTITUTE AMOLF   (Netherlands)

^b RADBOUD UNIVERSITY NIJMEGEN   (Netherlands)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0001739415     PISSN: 00218898     EISSN: None     Source Type: Journal    
DOI: 10.1107/S0021889897009990     Document Type: Article

References (11)

1. Bloch, J. M. (1985). J. Appl. Cryst. 18, 33-36.
2. Evans-Lutterodt, K. W. & Tang, M.-T. (1995). J. Appl. Cryst. 28, 318-326.
3. Feidenhans'l, R. (1989). Surf. Sci. Rep. 10, 105-188.
4. Feidenhans'l, R. (1997). Personal communication.
5. Ferrer, S. & Comin, F. (1995). Rev. Sci. Instrum. 66, 1674-1676.
6. Lohmeier, M. & Vlieg, E. (1993). J. Appl. Cryst. 26, 706-716.
7. Renaud, G., Villette, B. & Guénard, P. (1995). Nucl. Instrum. Methods, B95, 422-430.
8. Robinson, I. K. (1991). Handbook on Synchrotron Radiation, Vol. 3, edited by G. S. Brown & D. E. Moncton, pp. 221-266. Amsterdam: North-Holland.
9. Vlieg, E. (1997). J. Appl. Cryst. 30, 532-543.
10. Vlieg, E. & Robinson, I. K. (1992). Synchrotron Radiation Crystallography, edited by P. Coppens, pp. 255-299. London: Academic Press.
11. Vlieg, E., van der Veen, J. F., Macdonald, J. E. & Miller, M. (1987). J. Appl. Cryst. 20, 330-337.