Front-end ASIC for a liquid argon TPC

IEEE Transactions on Nuclear Science

Volumn 58, Issue 3 PART 3, 2011, Pages 1376-1385

  De Geronimo, Gianluigi ^a   D'Andragora, Alessio ^b   Li, Shaorui ^a   Nambiar, Neena ^a   Rescia, Sergio ^a   Vernon, Emerson ^a   Chen, Hucheng ^a   Lanni, Francesco ^a   Makowiecki, Don ^a   Radeka, Veljko ^a   Thorn, Craig ^a   Yu, Bo ^a  

^a BROOKHAVEN NATIONAL LABORATORY   (United States)

^b UNIVERSITY OF L'AQUILA   (Italy)

Author keywords

Analog to digital converter (ADC); application specific integrated circuit (ASIC); cryogenic; noise

Indexed keywords

ANALOG FRONT END; ANALOG TO DIGITAL CONVERTERS; APPLICATION-SPECIFIC INTEGRATED CIRCUIT (ASIC); COMMERCIAL TECHNOLOGY; COMPLEMENTARY METAL OXIDE SEMICONDUCTORS; CRYOGENIC ENVIRONMENT; DC CHARACTERISTICS; INPUT CAPACITANCE; LIQUID ARGON; LONG BASE LINE; LOW NOISE; LOW POWER; LOW-FREQUENCY COMPONENTS; LOWER NOISE; METAL OXIDE SEMICONDUCTOR; NEUTRINO OSCILLATIONS; NOISE; NOISE SPECTRAL DENSITY;

ANALOG TO DIGITAL CONVERSION; CRYOGENICS; DC POWER TRANSMISSION; DIGITAL INTEGRATED CIRCUITS; FIELD EFFECT TRANSISTORS; LIQUEFIED GASES; SPECTRAL DENSITY; TRANSISTORS; WIRE;

APPLICATION SPECIFIC INTEGRATED CIRCUITS;

EID: 79959373027     PISSN: 00189499     EISSN: None     Source Type: Journal    
DOI: 10.1109/TNS.2011.2127487     Document Type: Article

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