Input noise modeling of deep submicron MOSFETs

SBMO/IEEE MTT-S International Microwave and Optoelectronics Conference Proceedings

Volumn , Issue , 2007, Pages 175-179

  Choudhary, S ^a   Qureshi, S ^a  

^a INDIAN INSTITUTE OF TECHNOLOGY KANPUR   (India)

Author keywords

Channel length modulation; Short channel effects; Thermal noise; Velocity saturation

Indexed keywords

ACOUSTIC NOISE; CORRELATION METHODS; ELECTROMAGNETIC WAVES; MICROWAVES; MODULATION; PHOTONICS; POLYSILICON;

CHANNEL LENGTH MODULATION; NOISE MODELLING; SHORT CHANNEL EFFECTS; THERMAL NOISE; VELOCITY SATURATION;

MOSFET DEVICES;

EID: 50449110860     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/IMOC.2007.4404239     Document Type: Conference Paper

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