CMOS device reliability for emerging cryogenic space electronics applications

2005 International Semiconductor Device Research Symposium

Volumn 2005, Issue , 2005, Pages 328-329

  Tianbing, Chen ^a   Najafizadeh, Laleh ^a   Chendong, Zhu ^a   Ahmed, Adnan ^a   Diestelhorst, Ryan ^a   Espinel, Gustavo ^a   Cressler, John D ^a  

^a GEORGIA INSTITUTE OF TECHNOLOGY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 33847217262     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (5)

1. W.F. Clark et al., ECTC, p. 544, 1991
2. P. Heremans et al. IEEE TED, p. 980, 1990
3. M. Song et al., IEEE TED, p. 268, 1997
4. B. Doyle et al., IEEE TED, p. 744, 1990
5. C. Hu et al., IEEE TED, ED-32, p. 375, 1985