MOSFET optimization in deep submicron technology for charge amplifiers

IEEE Transactions on Nuclear Science

Volumn 52, Issue 6, 2005, Pages 3223-3232

  De Geronimo, Gianluigi ^a   O'Connor, Paul ^a  

^a BROOKHAVEN NATIONAL LABORATORY   (United States)

Author keywords

Charge amplifier; CMOS; MOSFET

Indexed keywords

AMPLIFIERS (ELECTRONIC); CAPACITANCE; MATHEMATICAL MODELS; OPTIMIZATION; SPURIOUS SIGNAL NOISE;

CHARGE AMPLIFIERS; DEEP SUBMICRON TECHNOLOGY; GATE CAPACITANCE;

MOSFET DEVICES;

EID: 33144478121     PISSN: 00189499     EISSN: None     Source Type: Journal    
DOI: 10.1109/TNS.2005.862938     Document Type: Conference Paper

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