Application of the quantum Hall effect to resistance metrology

Comptes Rendus Physique

Volumn 12, Issue 4, 2011, Pages 347-368

  Poirier, Wilfrid ^a   Schopfer, Félicien ^a   Guignard, Jérémie ^a   Thévenot, Olivier ^a   Gournay, Pierre ^a  

^a Quantum Metrology Group   (France)

Author keywords

Electrical metrology; Fundamental constants of physics; Fundamental metrology; Graphene; Quantum Hall effect; Semiconductors

Indexed keywords

EID: 79958809077     PISSN: 16310705     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.crhy.2011.04.008     Document Type: Short Survey

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