Quantum hall effect and ohm metrology

International Journal of Modern Physics B

Volumn 23, Issue 12-13, 2009, Pages 2779-2789

  Poirier, W ^a   Schopfer, F ^a  

^a LABORATOIRE NATIONAL DE MÉTROLOGIE ET D ESSAIS LNE   (France)

Author keywords

Arrays; Fundamental constants; Metrology; Ohm; Quantum Hall effect; Universality test; Wheatstone bridge

Indexed keywords

EID: 68149156900     PISSN: 02179792     EISSN: None     Source Type: Journal    
DOI: 10.1142/s0217979209062360     Document Type: Article

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