-
1
-
-
33845581695
-
Reliability Investigations of leadless QFN packages until End-of-Life with Application-Specific Board-Level Stress Tests
-
San Diego, USA
-
BIRZER C, STOECKL S, SCHUETZ G, et al. Reliability Investigations of leadless QFN packages until End-of-Life with Application-Specific Board-Level Stress Tests[C]//2006 Electronic Components and Technology Conference, San Diego, USA, 2006: 594-600.
-
(2006)
2006 Electronic Components and Technology Conference
, pp. 594-600
-
-
Birzer, C.1
Stoeckl, S.2
Schuetz, G.3
-
2
-
-
33846627794
-
Thermal cycling reliability of SnAgCu and SnPb solder joints: A comparison for several IC-packages
-
VANDEVELDE B, GONZALEZ M, LIMAYE P, et al. Thermal cycling reliability of SnAgCu and SnPb solder joints: A comparison for several IC-packages[J]. Microelectronics Reliability, 2007, 47(2-3): 259-265.
-
(2007)
Microelectronics Reliability
, vol.47
, Issue.2-3
, pp. 259-265
-
-
Vandevelde, B.1
Gonzalez, M.2
Limaye, P.3
-
3
-
-
67349120564
-
An anisotropic mechanical fatigue damage evolution model for Pb-free solder materials
-
LADANI L J, RAZMI J. An anisotropic mechanical fatigue damage evolution model for Pb-free solder materials[J]. Mechanics of Materials, 2008, 41(7): 878-885.
-
(2008)
Mechanics of Materials
, vol.41
, Issue.7
, pp. 878-885
-
-
Ladani, L.J.1
Razmi, J.2
-
4
-
-
0042665466
-
Comprehensive board-level solder joint reliability modeling and testing of QFN and power QFN packages
-
TEE T Y, NG H S, YAP D, et al. Comprehensive board-level solder joint reliability modeling and testing of QFN and power QFN packages[J]. Microelectronics Reliability, 2003, 43(8): 1329-1338.
-
(2003)
Microelectronics Reliability
, vol.43
, Issue.8
, pp. 1329-1338
-
-
Tee, T.Y.1
Ng, H.S.2
Yap, D.3
-
5
-
-
36448964875
-
Solder joint formation simulation and reliability study of quad flat no lead package
-
HUANG C Y, WU Z H, ZHOU D J. Solder joint formation simulation and reliability study of quad flat no lead package[J]. Science and Technology of Welding and Joining, 2007, 12(1): 100-105.
-
(2007)
Science and Technology of Welding and Joining
, vol.12
, Issue.1
, pp. 100-105
-
-
Huang, C.Y.1
Wu, Z.H.2
Zhou, D.J.3
-
6
-
-
33846614192
-
Numerical modeling of warpage induced in QFN array molding process
-
YANG D G, JANSEN K M B, ERNST L J, et al. Numerical modeling of warpage induced in QFN array molding process[J]. Microelectronics Reliability, 2007, 47(2, 3): 310-318.
-
(2007)
Microelectronics Reliability
, vol.47
, Issue.2-3
, pp. 310-318
-
-
Yang, D.G.1
Jansen, K.M.B.2
Ernst, L.J.3
-
7
-
-
49249093936
-
Predictive models for μBGA and QFN reliability estimation
-
Freiburg im Breisgau, Germany
-
WILDE J, ZUKOWSKI E. Predictive models for μBGA and QFN reliability estimation[C]//Conference on Thermal, Mechanical and Multiphysics Simulation and Experiments in Micro-Electronics and Micro-Systems, Freiburg im Breisgau, Germany, 2008: 1-9.
-
(2008)
Conference on Thermal, Mechanical and Multiphysics Simulation and Experiments in Micro-Electronics and Micro-Systems
, pp. 1-9
-
-
Wilde, J.1
Zukowski, E.2
-
8
-
-
61349095933
-
Solder-joint reliability of HVQFN-packages subjected to thermal cycling
-
DEVRIES J, JANSEN M, DRIEL W. Solder-joint reliability of HVQFN-packages subjected to thermal cycling[J]. Microelectronics Reliability, 2009, 49(3): 331-339.
-
(2009)
Microelectronics Reliability
, vol.49
, Issue.3
, pp. 331-339
-
-
Devries, J.1
Jansen, M.2
Driel, W.3
-
9
-
-
45449111778
-
Effect of leads pitch on soldered joint reliability of QFP device with finite element analysis
-
(in Chinese)
-
SHENG Zhong, XUE Songbai, ZHANG Liang, et al. Effect of leads pitch on soldered joint reliability of QFP device with finite element analysis[J]. Transactions of the China Welding Institution, 2008, 29(5): 85-88. (in Chinese)
-
(2008)
Transactions of the China Welding Institution
, vol.29
, Issue.5
, pp. 85-88
-
-
Sheng, Z.1
Xue, S.2
Zhang, L.3
-
10
-
-
33846627794
-
Thermal cycling reliability of SnAgCu and SnPb solder joints: A comparison for several IC-packages
-
VANDEVELDE Bart, GONZALEZ Mario, LIMAYE Paresh, et al. Thermal cycling reliability of SnAgCu and SnPb solder joints: A comparison for several IC-packages[J]. Microelectronics Reliability, 2007, 47(2, 3): 259-265.
-
(2007)
Microelectronics Reliability
, vol.47
, Issue.2-3
, pp. 259-265
-
-
Vandevelde, B.1
Gonzalez, M.2
Limaye, P.3
-
11
-
-
36348985822
-
Thermo-Mechanical analysis of a chip scale package (CSP) using lead free and lead containing solder materials
-
Czech
-
GONZALEZ M, VANDEVELDE B, BEYNE E. Thermo- Mechanical analysis of a chip scale package (CSP) using lead free and lead containing solder materials[C]//European Microelectronics and Packaging Symposium, Czech, 2004: 247-252.
-
(2004)
European Microelectronics and Packaging Symposium
, pp. 247-252
-
-
Gonzalez, M.1
Vandevelde, B.2
Beyne, E.3
-
12
-
-
33747750870
-
Modern IC packaging trends and their reliability implications
-
PLIENINGER R, DITTES M, PRESSEL, K. Modern IC packaging trends and their reliability implications[J]. Microelectronics Reliability, 2006, 46(9-11): 1868-1873.
-
(2006)
Microelectronics Reliability
, vol.46
, Issue.9-11
, pp. 1868-1873
-
-
Plieninger, R.1
Dittes, M.2
Pressel, K.3
-
13
-
-
34548493438
-
Effects of lead width and pitches on reliability of quad flat package (QFP) soldered joints
-
XUE Songbai, WU Yuxiu, HAN Zongjie, et al. Effects of lead width and pitches on reliability of quad flat package (QFP) soldered joints[J]. Chinese Journal of Mechanical Engineering, 2007, 20(4): 40-43.
-
(2007)
Chinese Journal of Mechanical Engineering
, vol.20
, Issue.4
, pp. 40-43
-
-
Xue, S.1
Wu, Y.2
Han, Z.3
-
14
-
-
33646538496
-
The effect of hygro-mechanical and thermo-mechanical stress on delamination of gold bump
-
KIM Dae Whan, KONG Byung-Seon. The effect of hygro-mechanical and thermo-mechanical stress on delamination of gold bump[J]. Microelectronics Reliability, 2006, 46(7): 1087-1094.
-
(2006)
Microelectronics Reliability
, vol.46
, Issue.7
, pp. 1087-1094
-
-
Kim, D.W.1
Kong, B.-S.2
-
15
-
-
58149305399
-
Mechanical properties of fine pitch devices soldered joints based on creep model
-
ZHANG Liang, XUE Songbai, HAN Zongjie, et al. Mechanical properties of fine pitch devices soldered joints based on creep model[J]. Chinese Journal of Mechanical Engineering, 2008, 21(6): 82-85.
-
(2008)
Chinese Journal of Mechanical Engineering
, vol.21
, Issue.6
, pp. 82-85
-
-
Zhang, L.1
Xue, S.2
Han, Z.3
-
16
-
-
33750294215
-
Stress analysis of lead-free solders with under bump metallurgy in a water level chip scale package
-
TSENG S C, CHEN R S, LIO C C. Stress analysis of lead-free solders with under bump metallurgy in a water level chip scale package[J]. The International Journal of Advanced Manufacturing Technology, 2006, 31(1, 2): 1-9.
-
(2006)
The International Journal of Advanced Manufacturing Technology
, vol.31
, Issue.1-2
, pp. 1-9
-
-
Tseng, S.C.1
Chen, R.S.2
Lio, C.C.3
-
17
-
-
48549086675
-
Numerical simulation of soldered joints and reliability analysis of PLCC components with J-shape leads
-
ZHANG Liang, XUE Songbai, LU Fangyan, et al. Numerical simulation of soldered joints and reliability analysis of PLCC components with J-shape leads[J]. China Welding, 2008, 17(2): 37-41.
-
(2008)
China Welding
, vol.17
, Issue.2
, pp. 37-41
-
-
Zhang, L.1
Xue, S.2
Lu, F.3
-
18
-
-
79958009090
-
Reduction of design steps for stacked die QFN using optimization technique
-
BACHOK N N, TALIB M Z M, AHMAD I. Reduction of design steps for stacked die QFN using optimization technique[J]. Solid State Science and Technology, 2008, 16(2): 119-128.
-
(2008)
Solid State Science and Technology
, vol.16
, Issue.2
, pp. 119-128
-
-
Bachok, N.N.1
Talib, M.Z.M.2
Ahmad, I.3
-
19
-
-
40449106167
-
Numerical simulation on soldered joints of QFP device with different substrate materials and thickness
-
(in Chinese)
-
ZHANG Liang, XUE Songbai, LU Fangyan, et al. Numerical simulation on soldered joints of QFP device with different substrate materials and thickness[J]. Transaction of the China Welding Institution, 2008, 29(1): 35-39. (in Chinese)
-
(2008)
Transaction of the China Welding Institution
, vol.29
, Issue.1
, pp. 35-39
-
-
Zhang, L.1
Xue, S.2
Lu, F.3
-
20
-
-
0032048931
-
Sensitivity study on material properties for the fatigue life prediction of solder joints under cyclic thermal loading
-
LEE S W, ZHANG X W. Sensitivity study on material properties for the fatigue life prediction of solder joints under cyclic thermal loading[J]. Circuit World, 1998, 24(3): 26-31.
-
(1998)
Circuit World
, vol.24
, Issue.3
, pp. 26-31
-
-
Lee, S.W.1
Zhang, X.W.2
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