메뉴 건너뛰기




Volumn 12, Issue 1, 2007, Pages 100-105

Solder joint formation simulation and reliability study of quad flat no lead package

Author keywords

Fatigue life; Finite element analysis; Process parameters; Quad flat no lead; Solder joint shape

Indexed keywords


EID: 36448964875     PISSN: 13621718     EISSN: 13621718     Source Type: Journal    
DOI: 10.1179/174329306X131857     Document Type: Conference Paper
Times cited : (6)

References (7)
  • 2
    • 28444433455 scopus 로고    scopus 로고
    • B. K. Lim, F. K. S. Poh, D. Y. R. Chong and S. W. Koh: Proc. 6th Conf. on 'Electronics packaging technology', Singapore, December 2004, IEEE, 197.
    • B. K. Lim, F. K. S. Poh, D. Y. R. Chong and S. W. Koh: Proc. 6th Conf. on 'Electronics packaging technology', Singapore, December 2004, IEEE, 197.


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.