Ellipsometric studies on TiO 2 thin films synthesized by spray pyrolysis technique

Applied Surface Science

Volumn 257, Issue 17, 2011, Pages 7399-7404

  Sundari, S Tripura ^a   Raut, N C ^a   Mathews, Tom ^a   Ajikumar, P K ^a   Dash, S ^a   Tyagi, A K ^a   Raj, Baldev ^a  

^a INDIRA GANDHI CENTRE FOR ATOMIC RESEARCH   (India)

Author keywords

Ellipsometry; Forouhi Bloomer model; Refractive index; Spray pyrolysis

Indexed keywords

ATOMIC FORCE MICROSCOPY; ELLIPSOMETRY; REFRACTIVE INDEX; SILICON ON INSULATOR TECHNOLOGY; SPRAY PYROLYSIS; SUBSTRATES; SURFACE ROUGHNESS; TITANIUM DIOXIDE;

EFFECTIVE MEDIUM APPROXIMATION; EMPIRICAL RELATIONS; EXPERIMENTAL INVESTIGATIONS; FOROUHI-BLOOMER MODEL; SPECTROSCOPIC ELLIPSOMETERS; SPRAY-PYROLYSIS TECHNIQUES; SUBSTRATE TEMPERATURE; TITANIA THIN FILMS;

THIN FILMS;

EID: 79957512903     PISSN: 01694332     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.apsusc.2011.02.064     Document Type: Article

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