Comparison of various parameterization models for optical functions of amorphous materials: application for sputtered titanium dioxide thin films

Japanese Journal of Applied Physics, Part 1: Regular Papers and Short Notes and Review Papers

Volumn 39, Issue 1, 2000, Pages 241-244

  Lee, Soonil ^a   Hong, Junegie ^b  

^a Ajou University   (South Korea)

^b INSTITUT DES MATÉRIAUX JEAN ROUXEL   (France)

Author keywords

[No Author keywords available]

Indexed keywords

ELLIPSOMETRY; ENERGY GAP; MATHEMATICAL MODELS; OPTICAL PROPERTIES; PARAMETER ESTIMATION; PHOTONS; REFRACTIVE INDEX; REGRESSION ANALYSIS; SPECTROSCOPY; SURFACE ROUGHNESS; TITANIUM DIOXIDE;

INTERBAND TRANSITION REGION; PARAMETERIZED OPTICAL FUNCTIONS; SELLMEIER DISPERSION FUNCTION;

AMORPHOUS FILMS;

EID: 0033906958     PISSN: 00214922     EISSN: None     Source Type: Journal    
DOI: 10.1143/JJAP.39.241     Document Type: Article

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