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Journal of Applied Physics

Volumn 93, Issue 12, 2003, Pages 9537-9541

Spectroscopic ellipsometry of thin film and bulk anatase (TiO2)

(5) Jellison Jr , G E a Boatner, L A a Budai, J D a Jeong, B S b Norton, D P b

a OAK RIDGE NATIONAL LABORATORY (United States)

b University of Florida (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ANISOTROPY; CRYSTAL STRUCTURE; ELLIPSOMETRY; MORPHOLOGY; POLARIZATION; THIN FILMS; TITANIUM DIOXIDE;

BAND EDGES;

SINGLE CRYSTALS;

EID: 0038143306 PISSN: 00218979 EISSN: None Source Type: Journal
DOI: 10.1063/1.1573737 Document Type: Article

Times cited : (250)

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