Optical characterization of nitrogenated carbon overcoats

Thin Solid Films

Volumn 308-309, Issue 1-4, 1997, Pages 284-288

  Chia, Ray Wen Jui ^a   Li, Eric ^b   Sugi, Seiki ^c   Li, G G ^d   Zhu, Helen ^d   Forouhi, A R ^d   Bloomer, Iris ^d  

^a WESTERN DIGITAL CORPORATION   (United States)

^b Alcashic Memories   (United States)

^c KUBOTA CORPORATION   (Japan)

^d Nandk Technology   (United States)

Author keywords

CNx films; Disk coatings; Nitrogenated carbon overcoats

Indexed keywords

ELECTRIC CONDUCTIVITY OF SOLIDS; LIGHT EXTINCTION; PROTECTIVE COATINGS; REFRACTIVE INDEX; SPECTROPHOTOMETRY; SPUTTER DEPOSITION; THICKNESS MEASUREMENT; THIN FILMS; WEAR OF MATERIALS;

FOROUHI BLOOMER DISPERSION EQUATIONS; NITROGENATED CARBON OVERCOATS;

MAGNETIC FILMS;

EID: 0031249746     PISSN: 00406090     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0040-6090(97)00405-7     Document Type: Article

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