Optical dispersion analysis of TiO2 thin films based on variable-angle spectroscopic ellipsometry measurements

Materials Science and Engineering B: Solid-State Materials for Advanced Technology

Volumn 68, Issue 1, 1999, Pages 42-47

  Mardare, Diana ^a   Hones, Peter ^b  

^a ALEXANDRU IOAN CUZA UNIVERSITY OF IASI   (Romania)

^b EPFL   (Switzerland)

Author keywords

[No Author keywords available]

Indexed keywords

ATOMIC FORCE MICROSCOPY; COMPOSITION EFFECTS; CRYSTALLIZATION; DOPING (ADDITIVES); ELLIPSOMETRY; ENERGY GAP; LIGHT EXTINCTION; REFRACTIVE INDEX; SPECTROSCOPIC ANALYSIS; SURFACE ROUGHNESS; THIN FILMS; TITANIUM DIOXIDE;

EXTINCTION COEFFICIENT; OPTICAL CONSTANTS; OPTICAL DISPERSION ANALYSIS;

OPTICAL FILMS;

EID: 0033284287     PISSN: 09215107     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0921-5107(99)00335-9     Document Type: Article

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