|
Volumn 257, Issue 17, 2011, Pages 7800-7804
|
Effects of magnesium film thickness and annealing temperature on formation of Mg 2 Si films on silicon (1 1 1) substrate deposited by magnetron sputtering
|
Author keywords
Annealing; Diffusion; Magnesium silicide; Scanning electron microscopy; Thin film; X ray diffraction
|
Indexed keywords
ANNEALING;
DIFFUSION;
FILM THICKNESS;
MAGNESIA;
MAGNETRON SPUTTERING;
OXIDE FILMS;
SCANNING ELECTRON MICROSCOPY;
SILICIDES;
SILICON;
SUBSTRATES;
X RAY DIFFRACTION;
ANNEALING FURNACE;
ANNEALING TEMPERATURES;
HIGH QUALITY;
MAGNESIUM SILICIDES;
MAGNETRON SPUTTERING METHOD;
POLYCRYSTALLINE;
POLYCRYSTALLINE FILM;
SEM IMAGE;
THIN FILMS;
|
EID: 79957460407
PISSN: 01694332
EISSN: None
Source Type: Journal
DOI: 10.1016/j.apsusc.2011.04.032 Document Type: Article |
Times cited : (25)
|
References (26)
|