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Volumn 257, Issue 17, 2011, Pages 7800-7804

Effects of magnesium film thickness and annealing temperature on formation of Mg 2 Si films on silicon (1 1 1) substrate deposited by magnetron sputtering

Author keywords

Annealing; Diffusion; Magnesium silicide; Scanning electron microscopy; Thin film; X ray diffraction

Indexed keywords

ANNEALING; DIFFUSION; FILM THICKNESS; MAGNESIA; MAGNETRON SPUTTERING; OXIDE FILMS; SCANNING ELECTRON MICROSCOPY; SILICIDES; SILICON; SUBSTRATES; X RAY DIFFRACTION;

EID: 79957460407     PISSN: 01694332     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.apsusc.2011.04.032     Document Type: Article
Times cited : (25)

References (26)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.