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Volumn 22, Issue 5, 2004, Pages 1971-1974
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Microstructure and Mg concentration of Mg-Si thin film deposited by ion beam sputtering on glass substrate
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Author keywords
[No Author keywords available]
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Indexed keywords
AMORPHOUS MATERIALS;
CRYSTALLINE MATERIALS;
GRAIN BOUNDARIES;
INTERMETALLICS;
ION BEAM ASSISTED DEPOSITION;
ION BEAMS;
MAGNESIUM COMPOUNDS;
MICROSTRUCTURE;
SEGREGATION (METALLOGRAPHY);
SPUTTER DEPOSITION;
TRANSMISSION ELECTRON MICROSCOPY;
COLUMNAR STRUCTURES;
ENERGY DISPERSIVE X-RAY MEASUREMENT;
GLASS SUBSTRATES;
ION BEAM SPUTTERING;
THIN FILMS;
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EID: 8444249312
PISSN: 07342101
EISSN: None
Source Type: Journal
DOI: 10.1116/1.1778406 Document Type: Article |
Times cited : (40)
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References (20)
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