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Volumn 22, Issue 5, 2004, Pages 1971-1974

Microstructure and Mg concentration of Mg-Si thin film deposited by ion beam sputtering on glass substrate

Author keywords

[No Author keywords available]

Indexed keywords

AMORPHOUS MATERIALS; CRYSTALLINE MATERIALS; GRAIN BOUNDARIES; INTERMETALLICS; ION BEAM ASSISTED DEPOSITION; ION BEAMS; MAGNESIUM COMPOUNDS; MICROSTRUCTURE; SEGREGATION (METALLOGRAPHY); SPUTTER DEPOSITION; TRANSMISSION ELECTRON MICROSCOPY;

EID: 8444249312     PISSN: 07342101     EISSN: None     Source Type: Journal    
DOI: 10.1116/1.1778406     Document Type: Article
Times cited : (40)

References (20)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.