Investigation of direct and indirect band gaps of [100]-oriented nearly strain-free β-FeSi2 films grown by molecular-beam epitaxy

Applied Physics Letters

Volumn 80, Issue 4, 2002, Pages 556-558

  Takakura, Ken Ichiro ^a   Hiroi, Noriyoshi ^a   Suemasu, Takashi ^a   Chichibu, Shigefusa F ^a   Hasegawa, Fumio ^a  

^a UNIVERSITY OF TSUKUBA   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

ABSORPTION EDGES; ABSORPTION TRANSITIONS; ANNEALED FILMS; CONTINUOUS FILMS; EFFECTIVE BAND GAP; INDIRECT BAND GAP; MULTI DOMAINS; STRAIN-FREE; TEMPERATURE DEPENDENCE;

ENERGY GAP; MOLECULAR BEAMS;

EPITAXIAL GROWTH;

EID: 79955998261     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1432755     Document Type: Article

References (25)

1. M. C. Bost and J. E. Mahan, J. Appl. Phys. 58, 2696 (1985). jap JAPIAU 0021-8979
2. T. Suemasu, Y. Negishi, K. Takakura, and F. Hasegawa, Jpn. J. Appl. Phys., Part 2 39, L1013 (2000). jjc JAPLD8 0021-4922
3. D. Leong, M. Harry, K. J. Reeson, and K. P. Homewood, Nature (London) 387, 686 (1997).; nat NATUAS 0028-0836
4. M. A. Lourenco, T. M. Butler, A. K. Kewell, R. M. Gwilliam, K. J. Kirkby, and K. P. Homewood, Jpn. J. Appl. Phys., Part 1 40, 4041 (2001). jjb JAPNDE 0021-4922
5. H. Katsumata, Y. Makita, N. Kobayashi, H. Shibata, M. Hasegawa, I. Aksenov, S. Kimura, A. Obata, and S. Uekusa, J. Appl. Phys. 80, 5955 (1996). jap JAPIAU 0021-8979
6. T. Koga, H. Tatsuoka, and H. Kuwabara, Appl. Surf. Sci. 169, 310 (2000). asu ASUSEE 0169-4332
7. T. D. Hunt, K. J. Reeson, R. M. Gwilliam, K. P. Homewood, R. J. Wilson, and B. J. Sealy, J. Lumin. 57, 25 (1993). jlu JLUMA8 0022-2313
8. T. Suemasu, Y. Likura, K. Takakura, and F. Hasegawa, J. Lumin. 87, 528 (2000). jlu JLUMA8 0022-2313
9. S. J. Clark, H. M. Al-Allak, S. Brand, and R. A. Abram, Phys. Rev. B 58, 10389 (1998). prb PRBMDO 0163-1829
10. L. Miglio and V. Meregalli, J. Vac. Sci. Technol. B 16, 1604 (1998). jvb JVTBD9 0734-211X
11. C. Giannini, S. Lagomarsino, F. Scarinci, and P. Castrucci Phys. Rev. B 45, 8822 (1992). prb PRBMDO 0163-1829
12. H. Kakemoto, H. Katsumata, T. Takada, Y. Tsai, M. Hasegawa, S. Sakuragi, N. Kobayashi, Y. Makita, T. Tsukamoto, and S. Uekusa, Mater. Sci. Eng., A 253, 284 (1998). msa MSAPE3 0921-5093
13. K. Radermacher, R. Carius, and S. Mantl, Nucl. Instrum. Methods Phys. Res. B 84, 163 (1994). nib NIMBEU 0168-583X
14. A. B. Filonov, V. E. Borisenko, W. Henrion, and H. Lange, J. Lumin. 80, 479 (1999). jlu JLUMA8 0022-2313
15. N. Hiroi, T. Suemasu, K. Takakura, N. Seki, and F. Hasegawa, Jpn. J. Appl. Phys., Part 2 40, L1008 (2001). jjc JAPLD8 0021-4922
16. M. Tanaka, Y. Kumagai, T. Suemasu, and F. Hasegawa, Jpn. J. Appl. Phys., Part 1 36, 3620 (1997). jjb JAPNDE 0021-4922
17. K. Takakura, T. Suemasu, N. Hiroi, and F. Hasegawa, Jpn. J. Appl. Phys., Part 2 39, L233 (2000). jjc JAPLD8 0021-4922
18. P. Y. Dusausoy, J. Protas, R. Wandji, and B. Roques, Acta Crystallogr., Sect. B: Struct. Crystallogr. Cryst. Chem. 27, 1209 (1971). acb ACBCAR 0567-7408
19. H.-U. Nissen, E. Mueller, H. R. Deller, and H. von Kaenel, Phys. Status Solidi A 150, 395 (1995). psa PSSABA 0031-8965
20. Z. Yang, K. P. Homewood, M. S. Finney, M. A. Harry, and K. J. Reeson, J. Appl. Phys. 78, 1958 (1995). jap JAPIAU 0021-8979
21. Y. Maeda, T. Fujita, T. Akita, K. Umezawa, and K. Miyake, Mater. Res. Soc. Symp. Proc. 486, 329 (1998). mrs MRSPDH 0272-9172
22. K. Yamaguchi and K. Mizushima, Phys. Rev. Lett. 86, 6006 (2001). prl PRLTAO 0031-9007
23. K. Takarabe, R. Teranishi, R. Oinuma, Y. Mori, T. Suemasu, S. Chichibu, and F. Hasegawa, Phys. Status Solidi B 233, 259 (2001). psb PSSBBD 0370-1972
24. T. Suemasu, Y. Negishi, K. Takakura, F. Hasegawa, and T. Chikyow Appl. Phys. Lett. 79, 1804 (2001). apl APPLAB 0003-6951
25. K. Takakura, T. Suemasu, and F. Hasegawa, Jpn. J. Appl. Phys., Part 2 40, L249 (2001). jjc JAPLD8 0021-4922