Imaging soft samples in liquid with tuning fork based shear force microscopy

Applied Physics Letters

Volumn 77, Issue 10, 2000, Pages 1557-1559

  Rensen, W H J ^a,b   Van Hulst, N F ^a   Kammer S B ^b  

^a UNIVERSITY OF TWENTE   (Netherlands)

^b ThermoMicroscopes   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0001527910     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1308058     Document Type: Article

References (10)

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