Thermographic analysis of localized conductive channels in bipolar resistive switching devices

Journal of Physics D: Applied Physics

Volumn 44, Issue 18, 2011, Pages

  Lu, Yi Meng ^a   Jiang, Wenkan ^a   Noman, Mohammad ^a   Bain, James A ^a   Salvador, Paul A ^a   Skowronski, Marek ^a  

^a CARNEGIE MELLON UNIVERSITY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

CONDUCTIVE CHANNELS; CONDUCTIVE PATHS; ELECTRICAL BIAS; HETEROSTRUCTURES; HOT SPOT; INFRARED THERMOGRAPHY; LATERAL SIZES; OXIDE HETEROSTRUCTURES; PT THIN FILMS; RESISTANCE SWITCHING; RESISTIVE SWITCHING; TEMPERATURE INCREASE; THERMOGRAPHIC ANALYSIS; VOLTAGE DEPENDENCE;

CRYSTALS; ELECTROCHEMISTRY; ELECTROFORMING; ELECTROMETALLURGY; PLATINUM; THERMOGRAPHY (IMAGING);

THERMOGRAPHY (TEMPERATURE MEASUREMENT);

EID: 79955381400     PISSN: 00223727     EISSN: 13616463     Source Type: Journal    
DOI: 10.1088/0022-3727/44/18/185103     Document Type: Article

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