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Advanced Materials

Volumn 22, Issue 3, 2010, Pages 411-414

Impact of defect distribution on resistive switching characteristics of Sr2TiO4 thin films

(4) Shibuya, Keisuke a,b Dittmann, Regina a Mi, Shaobo a Waser, Rainer a

a FORSCHUNGSZENTRUM JÜLICH (Germany)

b RIKEN (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

DEFECT DISTRIBUTION; HIGH DENSITY; MICROSCOPIC SWITCHING; ORDERED MICROSTRUCTURES; OXIDE THIN FILMS; RESISTIVE SWITCHING; TIO;

DEFECTS; SWITCHING; SWITCHING SYSTEMS; THIN FILMS;

OXIDE FILMS;

OXIDE; STRONTIUM; TITANIUM;

ARTICLE; CHEMISTRY;

OXIDES; STRONTIUM; TITANIUM;

EID: 76649125543 PISSN: 09359648 EISSN: 15214095 Source Type: Journal
DOI: 10.1002/adma.200901493 Document Type: Article

Times cited : (218)

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