Synchrotron-based spectroscopy for the characterization of surfaces and interfaces in chalcopyrite thin-film solar cells

Solar Energy Materials and Solar Cells

Volumn 95, Issue 6, 2011, Pages 1495-1508

  Lauermann, Iver ^a   Bär, Marcus ^a   Fischer, Christian Herbert ^a  

^a HAHN MEITNER INSTITUT   (Germany)

Author keywords

Chalcopyrite solar cells; Interface analysis; Photoelectron spectroscopy; X ray emission spectroscopy

Indexed keywords

ABSORBER LAYERS; ANALYSIS CAPABILITIES; CHALCOPYRITE SOLAR CELLS; CHEMICAL PREPARATION; CONTROLLED CONDITIONS; ELECTRON ANALYZER; END STATIONS; INTERFACE ANALYSIS; NEAR-SURFACE; ORGANICS; PHYSICAL DEVICES; RADIATION-SENSITIVE MATERIALS; REAL-WORLD; RESEARCH AREAS; SAMPLE STRUCTURE; SAMPLE SURFACE; SPECTROSCOPIC INVESTIGATIONS; SPECTROSCOPY MEASUREMENTS; SURFACE AND INTERFACES; SURFACES AND INTERFACES; THIN-FILM SOLAR CELLS; TIME RESOLVED MEASUREMENT; UV SOURCES; X-RAY EMISSION; X-RAY EMISSION SPECTROSCOPY;

CHEMICAL ANALYSIS; COPPER COMPOUNDS; ELECTROMAGNETIC WAVE EMISSION; ELECTRONIC STRUCTURE; EMISSION SPECTROSCOPY; FILM PREPARATION; GALLIUM; INERT GASES; ION BEAMS; MONOLAYERS; NANOSTRUCTURED MATERIALS; PHASE INTERFACES; PHOTOELECTRICITY; PHOTONS; SOLAR CELLS; SPECTROMETERS; SURFACE ANALYSIS; SURFACES; SYNCHROTRONS; X RAY ANALYSIS; X RAY PHOTOELECTRON SPECTROSCOPY; X RAY SCATTERING; X RAYS;

SPECTRUM ANALYSIS;

EID: 79955007132     PISSN: 09270248     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.solmat.2010.12.042     Document Type: Article

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