-
1
-
-
38449085915
-
-
PPHOED 1062-7995 10.1002/pip.808
-
M. A. Green, K. Emery, Y. Hishikawa, and W. Warta, Prog. Photovoltaics PPHOED 1062-7995 10.1002/pip.808 16, 61 (2008).
-
(2008)
Prog. Photovoltaics
, vol.16
, pp. 61
-
-
Green, M.A.1
Emery, K.2
Hishikawa, Y.3
Warta, W.4
-
3
-
-
9944227063
-
-
JAPIAU 0021-8979 10.1063/1.351775
-
A. J. Nelson, D. Niles, L. L. Kazmerski, D. Rioux, R. Patel, and H. Höchst, J. Appl. Phys. JAPIAU 0021-8979 10.1063/1.351775 72, 976 (1992).
-
(1992)
J. Appl. Phys.
, vol.72
, pp. 976
-
-
Nelson, A.J.1
Niles, D.2
Kazmerski, L.L.3
Rioux, D.4
Patel, R.5
Höchst, H.6
-
4
-
-
0035284173
-
-
SEMCEQ 0927-0248 10.1016/S0927-0248(00)00283-X
-
N. Kohara, S. Nishiwaki, Y. Hashimoto, T. Negami, and T. Wada, Sol. Energy Mater. Sol. Cells SEMCEQ 0927-0248 10.1016/S0927-0248(00)00283-X 67, 209 (2001).
-
(2001)
Sol. Energy Mater. Sol. Cells
, vol.67
, pp. 209
-
-
Kohara, N.1
Nishiwaki, S.2
Hashimoto, Y.3
Negami, T.4
Wada, T.5
-
5
-
-
0030381515
-
-
Conference Record 25th IEEE Photovoltaic Specialists Conference (Cat. No. 96CH35897), Washington, DC
-
W. N. Shafarman and J. E. Phillips, Conference Record 25th IEEE Photovoltaic Specialists Conference (Cat. No. 96CH35897), Washington, DC, 1996, p. 917.
-
(1996)
, pp. 917
-
-
Shafarman, W.N.1
Phillips, J.E.2
-
6
-
-
0007685687
-
-
APPLAB 0003-6951 10.1063/1.92955
-
P. E. Russell, O. Jamjoum, R. K. Ahrenkiel, L. L. Kazmerski, R. A. Mickelsen, and W. S. Chen, Appl. Phys. Lett. APPLAB 0003-6951 10.1063/1.92955 40, 995 (1982).
-
(1982)
Appl. Phys. Lett.
, vol.40
, pp. 995
-
-
Russell, P.E.1
Jamjoum, O.2
Ahrenkiel, R.K.3
Kazmerski, L.L.4
Mickelsen, R.A.5
Chen, W.S.6
-
7
-
-
49249101133
-
-
First World Conference on Photovoltaic Energy Conversion/Conference Record 24th IEEE Photovoltaic Specialists Conference (Cat. No. 94CH3365-4), Hawaii
-
T. Löher, C. Pettenkofer, and W. Jaegermann, First World Conference on Photovoltaic Energy Conversion/Conference Record 24th IEEE Photovoltaic Specialists Conference (Cat. No. 94CH3365-4), Hawaii, 1994, p. 295.
-
(1994)
, pp. 295
-
-
Löher, T.1
Pettenkofer, C.2
Jaegermann, W.3
-
8
-
-
0026173504
-
-
THSFAP 0040-6090 10.1016/0040-6090(91)90124-G
-
S. Raud and M. A. Nicolet, Thin Solid Films THSFAP 0040-6090 10.1016/0040-6090(91)90124-G 201, 361 (1991).
-
(1991)
Thin Solid Films
, vol.201
, pp. 361
-
-
Raud, S.1
Nicolet, M.A.2
-
9
-
-
77956731240
-
Proceedings to the Ninth International Conference of Ternary and Multinary Compounds
-
H. Sato, T. Hama, E. Niemi, Y. Ichikawa, and H. Sakai, Proceedings to the Ninth International Conference of Ternary and Multinary Compounds [Jpn. J. Appl. Phys., Suppl. 32, 50 (1993)].
-
(1993)
Jpn. J. Appl. Phys., Suppl.
, vol.32
, pp. 50
-
-
Sato, H.1
Hama, T.2
Niemi, E.3
Ichikawa, Y.4
Sakai, H.5
-
10
-
-
49249086528
-
-
Proceedings of the 12th European Photovoltaic Solar Energy Conference, Amsterdam, Netherlands
-
D. Schmid, J. Kessler, and H. W. Schock, Proceedings of the 12th European Photovoltaic Solar Energy Conference, Amsterdam, Netherlands, 1994 (unpublished), p. 653.
-
(1994)
, pp. 653
-
-
Schmid, D.1
Kessler, J.2
Schock, H.W.3
-
12
-
-
0030260355
-
-
JAPLD8 0021-4922 10.1143/JJAP.35.L1253
-
T. Wada, N. Kohara, T. Negami, and M. Nishitani, Jpn. J. Appl. Phys., Part 2 JAPLD8 0021-4922 10.1143/JJAP.35.L1253 35, L1253 (1996)
-
(1996)
Jpn. J. Appl. Phys., Part 2
, vol.35
, pp. 1253
-
-
Wada, T.1
Kohara, N.2
Negami, T.3
Nishitani, M.4
-
13
-
-
0031650126
-
-
JAPLD8 0021-4922 10.1143/JJAP.37.L71
-
S. Nishiwaki, N. Kohara, T. Negami, and T. Wada, Jpn. J. Appl. Phys., Part 2 JAPLD8 0021-4922 10.1143/JJAP.37.L71 37, L71 (1998)
-
(1998)
Jpn. J. Appl. Phys., Part 2
, vol.37
, pp. 71
-
-
Nishiwaki, S.1
Kohara, N.2
Negami, T.3
Wada, T.4
-
14
-
-
0035967557
-
-
THSFAP 0040-6090 10.1016/S0040-6090(00)01846-0
-
T. Wada, N. Kohara, S. Nishiwaki, and T. Negami, Thin Solid Films THSFAP 0040-6090 10.1016/S0040-6090(00)01846-0 387, 118 (2001).
-
(2001)
Thin Solid Films
, vol.387
, pp. 118
-
-
Wada, T.1
Kohara, N.2
Nishiwaki, S.3
Negami, T.4
-
15
-
-
0030108303
-
-
JAPIAU 0021-8979 10.1063/1.361095
-
R. Takei, H. Tanino, S. Chichibu, and H. Nakanishi, J. Appl. Phys. JAPIAU 0021-8979 10.1063/1.361095 79, 2793 (1996).
-
(1996)
J. Appl. Phys.
, vol.79
, pp. 2793
-
-
Takei, R.1
Tanino, H.2
Chichibu, S.3
Nakanishi, H.4
-
16
-
-
0035108169
-
-
JVTAD6 0734-2101 10.1116/1.1329123
-
J. Álvarez-García, A. Pérez-Rodríguez, A. Romano-Rodríguez, J. R. Morante, L. Calvo-Barrio, R. Scheer, and R. Klenk, J. Vac. Sci. Technol. A JVTAD6 0734-2101 10.1116/1.1329123 19, 232 (2001)
-
(2001)
J. Vac. Sci. Technol. a
, vol.19
, pp. 232
-
-
Álvarez-García, J.1
Pérez-Rodríguez, A.2
Romano-Rodríguez, A.3
Morante, J.R.4
Calvo-Barrio, L.5
Scheer, R.6
Klenk, R.7
-
17
-
-
34249951375
-
-
JAPIAU 0021-8979 10.1063/1.2734103
-
V. Izquíerdo-Roca, A. Perez-Rodríguez, A. Romano-Rodríguez, J. R. Morante, J. Álvarez-García, and L. Calvo-Barrio, J. Appl. Phys. JAPIAU 0021-8979 10.1063/1.2734103 101, 103517 (2007).
-
(2007)
J. Appl. Phys.
, vol.101
, pp. 103517
-
-
Izquíerdo-Roca, V.1
Perez-Rodríguez, A.2
Romano- Rodríguez, A.3
Morante, J.R.4
Álvarez-García, J.5
Calvo-Barrio, L.6
-
18
-
-
0035967561
-
-
THSFAP 0040-6090 10.1016/S0040-6090(00)01800-9
-
V. Probst, W. Stetter, W. Riedl, H. Vogt, M. Wendl, H. Calwer, S. Zweigart, K.-D. Ufert, B. Freienstein, H. Cerva, and F. H. Karg, Thin Solid Films THSFAP 0040-6090 10.1016/S0040-6090(00)01800-9 387, 262 (2001).
-
(2001)
Thin Solid Films
, vol.387
, pp. 262
-
-
Probst, V.1
Stetter, W.2
Riedl, W.3
Vogt, H.4
Wendl, M.5
Calwer, H.6
Zweigart, S.7
Ufert, K.-D.8
Freienstein, B.9
Cerva, H.10
Karg, F.H.11
-
19
-
-
79956054234
-
-
APPLAB 0003-6951 10.1063/1.1506205
-
Th. Glatzel, D. Fuértes-Marron, Th. Schedel-Niedrig, S. Sadewasser, and M. Ch. Lux-Steiner, Appl. Phys. Lett. APPLAB 0003-6951 10.1063/1.1506205 81, 2017 (2002)
-
(2002)
Appl. Phys. Lett.
, vol.81
, pp. 2017
-
-
Glatzel, Th.1
Fuértes-Marron, D.2
Schedel-Niedrig, Th.3
Sadewasser, S.4
Ch. Lux-Steiner, M.5
-
20
-
-
4243406546
-
-
THSFAP 0040-6090
-
R. Würz, D. Fuertes Marrón, A. Meeder, A. Rumberg, S. M. Babu, Th. Schedel-Niedrig, U. Bloeck, P. Schubert-Bischoff, and M. Ch. Lux-Steiner, Thin Solid Films THSFAP 0040-6090 431-432, 398 (2003)
-
(2003)
Thin Solid Films
, vol.431-432
, pp. 398
-
-
Würz, R.1
Fuertes Marrón, D.2
Meeder, A.3
Rumberg, A.4
Babu, S.M.5
Schedel-Niedrig, Th.6
Bloeck, U.7
Schubert-Bischoff, P.8
Ch. Lux-Steiner, M.9
-
21
-
-
18844430348
-
-
JAPIAU 0021-8979 10.1063/1.1891274
-
D. Fuertes Marrón, A. Meeder, S. Sadewasser, R. Würz, and C. A. Kaufmann, Th. Glatzel, Th. Schedel-Niedrig, and M. Ch. Lux-Steiner, J. Appl. Phys. JAPIAU 0021-8979 10.1063/1.1891274 97, 094915 (2005).
-
(2005)
J. Appl. Phys.
, vol.97
, pp. 094915
-
-
Fuertes Marrón, D.1
Meeder, A.2
Sadewasser, S.3
Würz, R.4
Kaufmann, C.A.5
Glatzel, Th.6
Schedel-Niedrig, Th.7
Ch. Lux-Steiner, M.8
-
22
-
-
0029305616
-
-
THSFAP 0040-6090 10.1016/0040-6090(94)06462-8
-
J. H. Scofield, A. Duda, D. Albin, B. L. Ballard, and P. K. Predecki, Thin Solid Films THSFAP 0040-6090 10.1016/0040-6090(94)06462-8 260, 26 (1995).
-
(1995)
Thin Solid Films
, vol.260
, pp. 26
-
-
Scofield, J.H.1
Duda, A.2
Albin, D.3
Ballard, B.L.4
Predecki, P.K.5
-
23
-
-
0034269317
-
-
JMSLD5 0261-8028 10.1023/A:1006756518551
-
T. D. Dzhafarov, M. S. Sadigov, E. Cingi, E. Bacaksiz, and M. Caliskan, J. Mater. Sci. Lett. JMSLD5 0261-8028 10.1023/A:1006756518551 19, 1521 (2000).
-
(2000)
J. Mater. Sci. Lett.
, vol.19
, pp. 1521
-
-
Dzhafarov, T.D.1
Sadigov, M.S.2
Cingi, E.3
Bacaksiz, E.4
Caliskan, M.5
-
24
-
-
0038694866
-
-
THSFAP 0040-6090 10.1016/S0040-6090(03)00257-8
-
K. Orgassa, H.-W. Schock, and J. H. Werner, Thin Solid Films THSFAP 0040-6090 10.1016/S0040-6090(03)00257-8 431-432, 387 (2003).
-
(2003)
Thin Solid Films
, vol.431-432
, pp. 387
-
-
Orgassa, K.1
Schock, H.-W.2
Werner, J.H.3
-
25
-
-
33244465780
-
-
JCPSA6 0021-9606 10.1063/1.2168443
-
L. Weinhardt, O. Fuchs, A. Peter, E. Umbach, C. Heske, J. Reichardt, M. Bär, I. Lauermann, I. Kötschau, A. Grimm, S. Sokoll, M. Ch. Lux-Steiner, T. P. Niesen, S. Visbeck, and F. Karg, J. Chem. Phys. JCPSA6 0021-9606 10.1063/1.2168443 124, 074705 (2006).
-
(2006)
J. Chem. Phys.
, vol.124
, pp. 074705
-
-
Weinhardt, L.1
Fuchs, O.2
Peter, A.3
Umbach, E.4
Heske, C.5
Reichardt, J.6
Bär, M.7
Lauermann, I.8
Kötschau, I.9
Grimm, A.10
Sokoll, S.11
Ch. Lux-Steiner, M.12
Niesen, T.P.13
Visbeck, S.14
Karg, F.15
-
26
-
-
34247328513
-
-
THSFAP 0040-6090 10.1016/j.tsf.2006.12.109
-
L. Weinhardt, M. Blum, M. Bär, C. Heske, O. Fuchs, E. Umbach, J. D. Denlinger, K. Ramanathan, and R. Noufi, Thin Solid Films THSFAP 0040-6090 10.1016/j.tsf.2006.12.109 515, 6119 (2007).
-
(2007)
Thin Solid Films
, vol.515
, pp. 6119
-
-
Weinhardt, L.1
Blum, M.2
Bär, M.3
Heske, C.4
Fuchs, O.5
Umbach, E.6
Denlinger, J.D.7
Ramanathan, K.8
Noufi, R.9
-
31
-
-
49249101134
-
-
S. Tougaard, QUASES-IMP-TPP2M code for the calculation of the inelastic electron mean-free path, Version 2.2 (http://www.quases.com/).
-
-
-
Tougaard, S.1
-
32
-
-
36449006933
-
-
JAPIAU 0021-8979 10.1063/1.353020
-
D. Schmid, M. Ruckh, F. Grunwald, and H.-W. Schock, J. Appl. Phys. JAPIAU 0021-8979 10.1063/1.353020 73, 2902 (1993).
-
(1993)
J. Appl. Phys.
, vol.73
, pp. 2902
-
-
Schmid, D.1
Ruckh, M.2
Grunwald, F.3
Schock, H.-W.4
-
33
-
-
0001088958
-
-
PRBMDO 0163-1829 10.1103/PhysRevB.24.7121
-
N. Mårtensson and R. Nyholm, Phys. Rev. B PRBMDO 0163-1829 10.1103/PhysRevB.24.7121 24, 7121 (1981).
-
(1981)
Phys. Rev. B
, vol.24
, pp. 7121
-
-
Mårtensson, N.1
Nyholm, R.2
-
34
-
-
49249086097
-
-
JJPYA5 0021-4922
-
T. Dzhafarov, M. Sadigov, E. Cingi, E. Bacaksiz, and M. Caliskan, Jpn. J. Appl. Phys., Suppl. JJPYA5 0021-4922 39, 194 (2000).
-
(2000)
Jpn. J. Appl. Phys., Suppl.
, vol.39
, pp. 194
-
-
Dzhafarov, T.1
Sadigov, M.2
Cingi, E.3
Bacaksiz, E.4
Caliskan, M.5
-
35
-
-
49249110303
-
-
According to the densities (ρ) and molar masses (M) for Mo, MoSe2, and MoS2 taken from the 87th Edition of the CRC Handbook of Chemistry and Physics
-
According to the densities (ρ) and molar masses (M) for Mo, MoSe2, and MoS2 taken from the 87th Edition of the CRC Handbook of Chemistry and Physics 2006-2007 (http://www.hbcpnetbase.com/), the respective molar densities (n=ρ/M) can be calculated to 0.106, 0.027, and 0.032 mol/ cm3, respectively. Multiplication of the molar density of MoSe2 [MoS2] with the intensity ratio of the Mo3d XPS signal of the "CIGSe [CIGSSe] back" and the Mo side (0.016 [0.026], see text) leads to the "Mo-doping" concentration (under the assumption that the doping profile is homogeneous within the information depth of XPS).
-
(2006)
-
-
-
36
-
-
49249106089
-
-
NIST X-Ray Photoelectron Spectroscopy Database, NIST Standard Reference Database 20, Version 3.4
-
NIST X-Ray Photoelectron Spectroscopy Database, NIST Standard Reference Database 20, Version 3.4 (http://srdata.nist.gov/xps/).
-
-
-
-
37
-
-
0003459529
-
-
edited by G. E. Muilenberg (Perkin-Elmer, Eden Prairie
-
C. D. Wagner, W. M. Riggs, L. E. Davis, and J. F. Moulder, in Handbook of X-Ray Photoelectron Spectroscopy, edited by, G. E. Muilenberg, (Perkin-Elmer, Eden Prairie, 1979).
-
(1979)
Handbook of X-Ray Photoelectron Spectroscopy
-
-
Wagner, C.D.1
Riggs, W.M.2
Davis, L.E.3
Moulder, J.F.4
-
38
-
-
49249127579
-
-
The Gibbs energy of formation for MoSe2 (MoS2) was determined for T=298.16 K according to Δ Gf0 =Δ Hf0 -T ΔS. The enthalpy Δ Hf0 for MoSe2 (MoS2) used for the calculations was -243.2 kJ/mol [-275.3 kJ/mol] taken from Begell House, New York
-
The Gibbs energy of formation for MoSe2 (MoS2) was determined for T=298.16 K according to Δ Gf0 =Δ Hf0 -T ΔS. The enthalpy Δ Hf0 for MoSe2 (MoS2) used for the calculations was -243.2 kJ/mol [-275.3 kJ/mol] taken from V. Ya. Leonidov and P. A. G. O'Hare, Fluorine Calorimetry (Begell House, New York, 1999), p. 194
-
(1999)
Fluorine Calorimetry
, pp. 194
-
-
Ya. Leonidov, V.1
O'Hare, P.A.G.2
-
39
-
-
38049176050
-
-
[JCTDAF 0021-9614 10.1016/0021-9614(70)90022-4
-
[P. A. G. O'Hare, E. Benn, F. Yu Cheng, and G. Kuzmycz, J. Chem. Thermodyn. JCTDAF 0021-9614 10.1016/0021-9614(70)90022-4 2, 797 (1970)]
-
(1970)
J. Chem. Thermodyn.
, vol.2
, pp. 797
-
-
O'Hare, P.A.G.1
Benn, E.2
Yu Cheng, F.3
Kuzmycz, G.4
-
40
-
-
49249086529
-
-
The change in entropy Δ S MoSe2 / MoS2 = S MoSe2 / MoS2 0 - S Mo 0 -2 S Se/S 0 was calculated from the standard entropies for the respective elements taken from
-
The change in entropy Δ S MoSe2 / MoS2 = S MoSe2 / MoS2 0 - S Mo 0 -2 S Se/S 0 was calculated from the standard entropies for the respective elements taken from http://www.qivx.com/ispt/ptw_st.php and S MoSe2 0 =83.3 J/Kmol [S MoS2 0 =62.6 J/Kmol]
-
-
-
-
43
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49249110716
-
-
resulting in Δ S MoSe2 =-30.2 J/Kmol [Δ S MoS2 =-29.7 J/Kmol].
-
resulting in Δ S MoSe2 =-30.2 J/Kmol [Δ S MoS2 =-29.7 J/Kmol].
-
-
-
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44
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49249135694
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-
For the Mo3d signal intensity reference of the bare (metallic) Mo layer (I0, see Sec. 2), we used the Mo3d intensity of the S-rich Mo (SZ Se1-Z) 2 contribution to the Mo-side spectrum [corrected by the molar ratio nMo / n MoS2 =3.3 (see Ref. for details)].
-
For the Mo3d signal intensity reference of the bare (metallic) Mo layer (I0, see Sec. 2), we used the Mo3d intensity of the S-rich Mo (SZ Se1-Z) 2 contribution to the Mo-side spectrum [corrected by the molar ratio nMo / n MoS2 =3.3 (see Ref. for details)].
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