Nondestructive depth-resolved spectroscopic investigation of the heavily intermixed In2 S3 /Cu (In,Ga) Se2 interface

Applied Physics Letters

Volumn 96, Issue 18, 2010, Pages

  Bar M ^a,b   Barreau, N ^c   Couzini Devy F ^c   Pookpanratana, S ^b   Klaer, J ^a   Blum, M ^b,d   Zhang, Y ^b   Yang, W ^e   Denlinger, J D ^e   Schock, H W ^a   Weinhardt, L ^d   Kessler, J ^c   Heske, C ^b  

^a HAHN MEITNER INSTITUT   (Germany)

^b UNIVERSITY OF NEVADA   (United States)

^c UNIVERSITÉ DE NANTES   (France)

^d UNIVERSITY OF WÜRZBURG   (Germany)

^e LAWRENCE BERKELEY NATIONAL LABORATORY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

COPPER; EMISSION SPECTROSCOPY; SOLAR ABSORBERS; SPECTROSCOPIC ANALYSIS; THIN FILM SOLAR CELLS; X RAYS;

CHEMICAL INTERFACES; COMPLEX INTERFACE; CU(IN , GA)SE2; DEPTH-RESOLVED; NON DESTRUCTIVE; SOFT X-RAY; SPECTROSCOPIC INVESTIGATIONS; SURFACE/INTERFACE;

INTERFACES (MATERIALS);

EID: 77952795949     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.3425739     Document Type: Article

References (25)

1. I. Repins, M. A. Contreras, B. Egaas, C. DeHart, J. Scharf, C. L. Perkins, B. To, and R. Noufi, Prog. Photovoltaics PPHOED 1062-7995 16, 235 (2008). 10.1002/pip.822
2. N. Barreau, J. C. Bernede, S. Marsillac, C. Amory, and W. N. Shafarman, Thin Solid Films THSFAP 0040-6090 431-432, 326 (2003). 10.1016/S0040-6090(03) 00216-5
3. D. Hariskos, R. Menner, S. Spiering, A. Eicke, M. Powalla, K. Ellmer, M. Oertel, and B. Dimmler, Proceedings of the 19th European Photovoltaic Solar Energy Conference., Paris, France, 7-11 June 2004.
4. E. B. Yousfi, B. Weinberger, F. Donsanti, P. Cowache, and D. Lincot, Thin Solid Films THSFAP 0040-6090 387, 29 (2001) 10.1016/S0040-6090(00)01838-1
5. N. Naghavi, S. Spiering, M. Powalla, B. Canava, and D. Lincot, Prog. Photovoltaics PPHOED 1062-7995 11, 437 (2003). 10.1002/pip.508 (Pubitemid 37320341)
6. N. A. Allsop, A. Schönmann, H. -J. Muffler, M. Bär, M. C. Lux-Steiner, and Ch. -H. Fischer, Prog. Photovoltaics PPHOED 1062-7995 13, 607 (2005). 10.1002/pip.655
7. S. Spiering, A. Eicke, D. Hariskos, M. Powalla, N. Naghavi, and D. Lincot, Thin Solid Films THSFAP 0040-6090 451-452, 562 (2004) 10.1016/j.tsf.2003.10.090
8. S. Gall, N. Barreau, S. Harel, J. C. Berńde, and J. Kessler, Thin Solid Films THSFAP 0040-6090 480-481, 138 (2005). 10.1016/j.tsf.2004.11.017 (Pubitemid 40642965)
9. D. Abou-Ras, G. Kostorz, A. Strom, H. -W. Schock, and A. N. Tiwari, J. Appl. Phys. JAPIAU 0021-8979 98, 123512 (2005), and references therein. 10.1063/1.2149166 (Pubitemid 43032101)
10. M. Bär, N. Allsop, I. Lauermann, and Ch. -H. Fischer, Appl. Phys. Lett. APPLAB 0003-6951 90, 132118 (2007). 10.1063/1.2717534 (Pubitemid 46516874)
11. P. Pistor, N. Allsop, W. Braun, R. Caballero, C. Camus, Ch. -H. Fischer, M. Gorgoi, A. Grimm, B. Johnson, T. Kropp, I. Lauermann, S. Lehmann, H. Mönig, S. Schorr, A. Weber, and R. Klenk, Phys. Status Solidi A PSSABA 0031-8965 206, 1059 (2009). 10.1002/pssa.200881162
12. N. Barreau, S. Marsillac, and J. C. Berńde, Vacuum VACUAV 0042-207X 56, 101 (2000). 10.1016/S0042-207X(99)00176-1 (Pubitemid 30555860)
13. J Klaer, J Bruns, R Henninger, K Siemer, R Klenk, K Ellmer, and D. Bräunig, Semicond. Sci. Technol. SSTEET 0268-1242 13, 1456 (1998), and references therein. 10.1088/0268-1242/13/12/022
14. C. D. Wagner, W. M. Riggs, L. E. Davis, and J. F. Moulder, in Handbook of X-Ray Photoelectron Spectroscopy, edited by, G. E. Moulder, (Perkin-Elmer, Eden Prairie, 1979), p. 15.
15. C. Heske, R. Fink, E. Umbach, W. Riedl, and F. Karg, Appl. Phys. Lett. APPLAB 0003-6951 68, 3431 (1996). 10.1063/1.115783 (Pubitemid 126684321)
16. S. Tanuma, C. J. Powell, and D. R. Penn, Surf. Interface Anal. SIANDQ 0142-2421 21, 165 (1994) 10.1002/sia.740210302; QUASES-IMFP-TPP2M code for the calculation of the inelastic electron mean free path, Version 2.2, http://www.quases.com/.
17. S. Raud and M. -A. Nicolet, Thin Solid Films THSFAP 0040-6090 201, 361 (1991). 10.1016/0040-6090(91)90124-G (Pubitemid 21698128)
18. R. Hunger, T. Schulmeyer, A. Klein, W. Jaegermann, K. Sakurai, A. Yamada, P. Fons, K. Matsubara, and S. Niki, Surf. Sci. SUSCAS 0039-6028 557, 263 (2004). 10.1016/j.susc.2004.03.055
19. T. Nakada, H. Ohbo, T. Watanabe, H. Nakazawa, M. Matsui, and A. Kunioka, Sol. Energy Mater. Sol. Cells SEMCEQ 0927-0248 49, 285 (1997). 10.1016/S0927-0248(97)00054-8
20. C. Heske, D. Eich, R. Fink, E. Umbach, T. van Buuren, C. Bostedt, L. J. Terminello, S. Kakar, M. M. Grush, T. A. Callcott, F. J. Himpsel, D. L. Ederer, R. C. C. Perera, W. Riedl, and F. Karg, Appl. Phys. Lett. APPLAB 0003-6951 74, 1451 (1999) 10.1063/1.123578
21. L. Weinhardt, M. Bär, S. Pookpanratana, M. Morkel, T. P. Niesen, F. Karg, K. Ramanathan, M. A. Contreras, R. Noufi, E. Umbach, and C. Heske, Appl. Phys. Lett. (to be published).
22. J. H. Scofield, J. Electron Spectrosc. Relat. Phenom. JESRAW 0368-2048 8, 129 (1976). 10.1016/0368-2048(76)80015-1
23. For a detailed discussion of the S L2,3 spectrum see, e.g., J. Reichardt, M. Bär, A. Grimm, I. Kötschau, I. Lauermann, S. Sokoll, M. C. Lux-Steiner, Ch. -H. Fischer, C. Heske, L. Weinhardt, O. Fuchs, Ch. Jung, W. Gudat, T. P. Niesen, and F. Karg, Appl. Phys. Lett. APPLAB 0003-6951 86, 172102 (2005). 10.1063/1.1906309 (Pubitemid 40865930)
24. N. Barreau and M. Tessier, Thin-Film Compound Semiconductor Photovoltaics, MRS Symposia Proceedings No. 1165 (Materials Research Society, Pittsburgh, 2009), p. M08-21.
25. Calculated using attenuation lengths from B. L. Henke, E. M. Gullikson, and J. C. Davis, At. Data Nucl. Data Tables ADNDAT 0092-640X 54, 181 (1993) 10.1006/adnd.1993.1013; http://www-cxro.lbl.gov/optical-constants/atten2.html.