Zn(O,OH) layers in chalcopyrite thin-film solar cells: Valence-band maximum versus composition

Journal of Applied Physics

Volumn 98, Issue 5, 2005, Pages

  Bar M ^a,c   Reichardt, J ^a,e   Grimm, A ^a   Kotschau I ^a   Lauermann, I ^a   Rahne, K ^a   Sokoll, S ^a   Lux Steiner, M C ^a,f   Fischer, Ch H ^a,f   Weinhardt, L ^b   Umbach, E ^b   Heske, C ^c   Jung, Ch ^a   Niesen, T P ^d   Visbeck, S ^d  

^a HAHN MEITNER INSTITUT   (Germany)

^b UNIVERSITY OF WÜRZBURG   (Germany)

^c UNIVERSITY OF NEVADA   (United States)

^d SHELL GLOBAL SOLUTIONS INTERNATIONAL B V   (United States)

^e UNIVERSITY OF BREMEN   (Germany)

^f FREIE UNIVERSITÄT BERLIN   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

CHALCOPYRITE; OPTICAL BAND GAPS; VALENCE-BAND MAXIMUM (VBM);

CADMIUM COMPOUNDS; LIGHT REFLECTION; PHOTOELECTRON SPECTROSCOPY; THIN FILMS; ZINC;

SOLAR CELLS;

EID: 25144496977     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.2034650     Document Type: Article

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