SAXES, a high resolution spectrometer for resonant x-ray emission in the 400-1600 eV energy range

Review of Scientific Instruments

Volumn 77, Issue 11, 2006, Pages

  Ghiringhelli, G ^a   Piazzalunga, A ^a   Dallera, C ^a   Trezzi, G ^a   Braicovich, L ^a   Schmitt, T ^b   Strocov, V N ^b   Betemps, R ^b   Patthey, L ^b   Wang, X ^c   Grioni, M ^c  

^a POLITECNICO DI MILANO   (Italy)

^b PAUL SCHERRER INSTITUTE   (Switzerland)

^c EPFL   (Switzerland)

Author keywords

[No Author keywords available]

Indexed keywords

CHARGE COUPLED DEVICES; EMISSION SPECTROSCOPY; FLUORESCENCE; LIGHT SOURCES; OPTICAL RESOLVING POWER; X RAY SCATTERING;

SCATTERING ANGLE; SPHERICAL GRATING; X-RAY EMISSION SPECTROSCOPY;

X RAY SPECTROMETERS;

EID: 33751568141     PISSN: 00346748     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.2372731     Document Type: Article

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