X-Ray Emission Spectroscopy of Cu(In,Ga)(S,Se)2-Based Thin Film Solar Cells: Electronic Structure, Surface Oxidation, and Buried Interfaces

Physica Status Solidi (A) Applied Research

Volumn 187, Issue 1, 2001, Pages 13-24

  Heske, C ^a   Groh, U ^a   Fuchs, O ^a   Umbach, E ^a   Franco, N ^b   Bostedt, C ^b   Terminello, L J ^b   Perera, R C C ^c   Hallmeier, K H ^d   Preobrajenski, A ^d   Szargan, R ^d   Zweigart, S ^e   Riedl, W ^e   Karg, F ^e  

^a UNIVERSITY OF WÜRZBURG   (Germany)

^b LAWRENCE LIVERMORE NATIONAL LABORATORY   (United States)

^c UNIVERSITY OF CALIFORNIA   (United States)

^d UNIVERSITY OF LEIPZIG   (Germany)

^e SIEMENS AG   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 18044400676     PISSN: 00318965     EISSN: None     Source Type: Journal    
DOI: 10.1002/1521-396X(200109)187:1<13::AID-PSSA13>3.0.CO;2-D     Document Type: Article

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