-
1
-
-
0022519741
-
ION-BASED METHOD FOR OPTICAL THIN FILM DEPOSITION.
-
P. J. Martin, "Ion-based methods for optical thin film deposition," J. Mater. Sci. 21, 1-25 (1986). (Pubitemid 16490478)
-
(1986)
Journal of Materials Science
, vol.21
, Issue.1
, pp. 1-25
-
-
Martin, P.J.1
-
2
-
-
19944415488
-
Summary abstract: Ion-beam sputter deposition of oxide films
-
J. R. Sites, H. Demiryont, and D. B. Kerwin, "Summary abstract: ion-beam sputter deposition of oxide films," J. Vac. Sci. Technol. A 3, 656-656 (1985).
-
(1985)
J. Vac. Sci. Technol. A
, vol.3
, pp. 656-656
-
-
Sites, J.R.1
Demiryont, H.2
Kerwin, D.B.3
-
3
-
-
33751377957
-
Deposition and spectral performance of an inhomogeneous broadband wide-angular antireflective coating
-
DOI 10.1364/AO.45.007851
-
V. Janicki, D. Gäbler, S. Wilbrandt, R. Leitel, O. Stenzel, N. Kaiser, M. Lappschies, B. Görtz, D. Ristau, C. Rickers, and M. Vergöhl, "Deposition and spectral performance of an inhomogeneous broadband wide-angular antireflective coating," Appl. Opt. 45, 7851-7857 (2006). (Pubitemid 44812760)
-
(2006)
Applied Optics
, vol.45
, Issue.30
, pp. 7851-7857
-
-
Janicki, V.1
Gabler, D.2
Wilbrandt, S.3
Leitel, R.4
Stenzel, O.5
Kaiser, N.6
Lappschies, M.7
Gortz, B.8
Ristau, D.9
Rickers, C.10
Vergohl, M.11
-
4
-
-
85088719911
-
Applications of mixture oxide materials for fs optics
-
Optical Society of America
-
M. Jupé, M. Lappschies, L. Jensen, K. Starke, and D. Ristau, "Applications of mixture oxide materials for fs optics," in Optical Interference Coatings (Optical Society of America, 2007), p. TuA6.
-
(2007)
Optical Interference Coatings
-
-
Jupé, M.1
Lappschies, M.2
Jensen, L.3
Starke, K.4
Ristau, D.5
-
5
-
-
58149268954
-
2 optical coatings with tunable index and their response to intense subpicosecond laser pulse irradiation
-
2 optical coatings with tunable index and their response to intense subpicosecond laser pulse irradiation," Appl. Phys. Lett. 93, 261903 (2008).
-
(2008)
Appl. Phys. Lett.
, vol.93
, pp. 261903
-
-
Nguyen, D.1
Emmert, L.A.2
Cravetchi, I.V.3
Mero, M.4
Rudolph, W.5
Jupe, M.6
Lappschies, M.7
Starke, K.8
Ristau, D.9
-
7
-
-
0011934516
-
Stress reduction in ion beam sputtered mixed oxide films
-
B. J. Pond, J. I. DeBar, C. K. Carniglia, and T. Raj, "Stress reduction in ion beam sputtered mixed oxide films," Appl. Opt. 28, 2800-2805 (1989).
-
(1989)
Appl. Opt.
, vol.28
, pp. 2800-2805
-
-
Pond, B.J.1
DeBar, J.I.2
Carniglia, C.K.3
Raj, T.4
-
8
-
-
33645323765
-
Application of optical broadband monitoring to quasi-rugate filters by ion-beam sputtering
-
M. Lappschies, B. Görtz, and D. Ristau, "Application of optical broadband monitoring to quasi-rugate filters by ion-beam sputtering," Appl. Opt. 45, 1502-1506 (2006).
-
(2006)
Appl. Opt.
, vol.45
, pp. 1502-1506
-
-
Lappschies, M.1
Görtz, B.2
Ristau, D.3
-
9
-
-
56349148877
-
State of the art in deterministic production of optical thin films
-
D. Ristau, H. Ehlers, S. Schlichting, and M. Lappschies, "State of the art in deterministic production of optical thin films," Proc. SPIE 7101, 71010C (2008).
-
(2008)
Proc. SPIE
, vol.7101
-
-
Ristau, D.1
Ehlers, H.2
Schlichting, S.3
Lappschies, M.4
-
10
-
-
33645303199
-
Rugate filter made with composite thin films by ion-beam sputtering
-
C.-C. Lee, C.-J. Tang, and J.-Y. Wu, "Rugate filter made with composite thin films by ion-beam sputtering," Appl. Opt. 45, 1333-1337 (2006).
-
(2006)
Appl. Opt.
, vol.45
, pp. 1333-1337
-
-
Lee, C.-C.1
Tang, C.-J.2
Wu, J.-Y.3
-
11
-
-
50849124494
-
Residual stress in Ta2O5 -SiO2 composite thin-film rugate filters prepared by radio frequency ion-beam sputtering
-
C.-J. Tang, C.-C. Jaing, K.-S. Lee, and C.-C. Lee, "Residual stress in Ta2O5 -SiO2 composite thin-film rugate filters prepared by radio frequency ion-beam sputtering," Appl. Opt. 47, C167-C171 (2008).
-
(2008)
Appl. Opt.
, vol.47
-
-
Tang, C.-J.1
Jaing, C.-C.2
Lee, K.-S.3
Lee, C.-C.4
-
12
-
-
1842664955
-
Graded refractive index layer systems for antireflective coatings and rugate filters deposited by reactive pulse magnetron sputtering
-
DOI 10.1016/j.surfcoat.2003.10.105, PII S0257897203012659
-
H. Bartzsch, S. Lange, P. Frach, and K. Goedicke, "Graded refractive index layer systems for antireflective coatings and rugate filters deposited by reactive pulse magnetron sputtering," Surf. Coat. Technol. 180-181, 616-620 (2004). (Pubitemid 38473629)
-
(2004)
Surface and Coatings Technology
, vol.180-181
, pp. 616-620
-
-
Bartzsch, H.1
Lange, S.2
Frach, P.3
Goedicke, K.4
-
13
-
-
79751514813
-
Summary abstract: An advanced multi-chamber system for preparation of amorphous thin films by coevaporation and their subsequent characterization by AES, ESCA, SIMS and ISS methods
-
D. M. Sanders, E. N. Farabaugh,W. S. Hurst, andW. K. Haller, "Summary abstract: an advanced multi-chamber system for preparation of amorphous thin films by coevaporation and their subsequent characterization by AES, ESCA, SIMS and ISS methods," J. Vac. Sci. Technol. 18, 1308-1310 (1981).
-
(1981)
J. Vac. Sci. Technol.
, vol.18
, pp. 1308-1310
-
-
Sanders, D.M.1
Farabaugh, E.N.2
Hurst, W.S.3
Haller, W.K.4
-
14
-
-
84975597902
-
Intrinsic stress and structural properties of mixed composition thin films
-
H. Sankur,W. J. Gunning, and J. F. DeNatale, "Intrinsic stress and structural properties of mixed composition thin films," Appl. Opt. 27, 1564-1567 (1988).
-
(1988)
Appl. Opt.
, vol.27
, pp. 1564-1567
-
-
Sankur, H.1
Gunning, W.J.2
DeNatale, J.F.3
-
15
-
-
0000308188
-
2MgO mixed-composite films evaporated from the solid solution
-
N. K. Sahoo and A. P. Shapiro, "Process-parameter-dependent optical and structural properties of ZrO2MgO mixedcomposite films evaporated from the solid solution," Appl. Opt. 37, 698-718 (1998). (Pubitemid 128657303)
-
(1998)
Applied Optics
, vol.37
, Issue.4
, pp. 698-718
-
-
Sahoo, N.K.1
Shapiro, A.P.2
-
17
-
-
0001335979
-
2/poly(vinylpyrrolidone) composite materials for optical waveguides
-
2/poly(vinylpyrrolidone) composite materials for optical waveguides," Chem. Mater. 8, 235-241 (1996). (Pubitemid 126485096)
-
(1996)
Chemistry of Materials
, vol.8
, Issue.1
, pp. 235-241
-
-
Yoshida, M.1
Prasad, P.N.2
-
18
-
-
39649107163
-
Refractive index profile modelling of dielectric inhomogeneous coatings using effective medium theories
-
DOI 10.1016/j.tsf.2007.09.016, PII S0040609007015891
-
V. Janicki, J. Sancho-Parramon, and H. Zorc, "Refractive index profile modelling of dielectric inhomogeneous coatings using effective medium theories," Thin Solid Films 516, 3368-3373 (2008). (Pubitemid 351288806)
-
(2008)
Thin Solid Films
, vol.516
, Issue.10
, pp. 3368-3373
-
-
Janicki, V.1
Sancho-Parramon, J.2
Zorc, H.3
-
19
-
-
0019539913
-
Optical properties of thin films
-
D. Aspnes, "Optical properties of thin films," Thin Solid Films 89, 249-262 (1982).
-
(1982)
Thin Solid Films
, vol.89
, pp. 249-262
-
-
Aspnes, D.1
-
20
-
-
0004877721
-
Modifying structure and properties of optical films by coevaporation
-
A. Feldman, E.N. Farabaugh,W. K. Haller, D. M. Sanders, and R. A. Stempniak, "Modifying structure and properties of optical films by coevaporation," J. Vac. Sci. Technol. A 4, 2969-2974 (1986).
-
(1986)
J. Vac. Sci. Technol. A
, vol.4
, pp. 2969-2974
-
-
Feldman, A.1
Farabaugh, E.N.2
Haller, W.K.3
Sanders, D.M.4
Stempniak, R.A.5
-
21
-
-
33744948115
-
Achieving superior band gap, refractive index and morphology in composite oxide thin film systems violating the Moss rule
-
DOI 10.1088/0022-3727/39/12/015, PII S0022372706204467
-
N. K. Sahoo, S. Thakur, and R. B. Tokas, "Achieving superior band gap, refractive index and morphology in composite oxide thin film systems violating the moss rule," J. Phys. D 39, 2571-2579 (2006). (Pubitemid 43855603)
-
(2006)
Journal of Physics D: Applied Physics
, vol.39
, Issue.12
, pp. 2571-2579
-
-
Sahoo, N.K.1
Thakur, S.2
Tokas, R.B.3
-
22
-
-
0037960265
-
Growth and properties of sputtered zirconia and zirconia-silica thin films
-
D. H. Kuo and C. H. Chien, "Growth and properties of sputtered zirconia and zirconia-silica thin films," Thin Solid Films 429, 40-45 (2003).
-
(2003)
Thin Solid Films
, vol.429
, pp. 40-45
-
-
Kuo, D.H.1
Chien, C.H.2
-
24
-
-
43949085349
-
2 mixture thin films
-
DOI 10.1016/j.tsf.2007.07.028, PII S0040609007012357
-
J. Sancho-Parramon, V. Janicki, and H. Zorc, "Compositional dependence of absorption coefficient and band-gap for Nb2O5 -SiO2 mixture thin films," Thin Solid Films 516, 5478-5482 (2008). (Pubitemid 351707482)
-
(2008)
Thin Solid Films
, vol.516
, Issue.16
, pp. 5478-5482
-
-
Sancho-Parramon, J.1
Janicki, V.2
Zorc, H.3
-
25
-
-
33645284157
-
Optical broadband monitoring of conventional and ion processes
-
D. Ristau, H. Ehlers, T. Gross, and M. Lappschies, "Optical broadband monitoring of conventional and ion processes," Appl. Opt. 45, 1495-1501 (2006).
-
(2006)
Appl. Opt.
, vol.45
, pp. 1495-1501
-
-
Ristau, D.1
Ehlers, H.2
Gross, T.3
Lappschies, M.4
-
26
-
-
84893892870
-
-
URL: http://www.optilayer.com.
-
-
-
-
28
-
-
84954824794
-
Berechnung verschiedener physikalischer konstanten von heterogenen substanzen. I. Dielektrizitätskonstanten und leitfähigkeiten der mischkörper aus isotropen substanzen
-
D. A. G. Bruggeman, "Berechnung verschiedener physikalischer konstanten von heterogenen substanzen. I. Dielektrizitätskonstanten und leitfähigkeiten der mischkörper aus isotropen substanzen," Ann. Phys. 416, 636-664 (1935).
-
(1935)
Ann. Phys.
, vol.416
, pp. 636-664
-
-
Bruggeman, D.A.G.1
-
29
-
-
84920707415
-
Ueber die beziehung zwischen der fortpflanzungsgeschwindigkeit des lichtes und der koerperdichte
-
A. H. A. Lorentz, "Ueber die beziehung zwischen der fortpflanzungsgeschwindigkeit des lichtes und der koerperdichte," Ann. Phys. 245, 641-665 (1880).
-
(1880)
Ann. Phys.
, vol.245
, pp. 641-665
-
-
Lorentz, A.H.A.1
-
30
-
-
84920708323
-
Ueber die refractionsconstante
-
L. Lorenz, "Ueber die refractionsconstante," Ann. Phys. 247, 70-103 (1880).
-
(1880)
Ann. Phys.
, vol.247
, pp. 70-103
-
-
Lorenz, L.1
-
31
-
-
0032739685
-
Amorphous phase influence on the optical bandgap of polysilicon
-
C. Rotaru, S. Nastase, and N. Tomozeiu, "Amorphous phase influence on the optical bandgap of polysilicon," Phys. Status Solidi A 171, 365-370 (1999).
-
(1999)
Phys. Status Solidi A
, vol.171
, pp. 365-370
-
-
Rotaru, C.1
Nastase, S.2
Tomozeiu, N.3
-
32
-
-
0344926558
-
Microstructure and electronic properties of InGaN alloys
-
DOI 10.1002/pssb.200303527
-
F. A. Ponce, S. Srinivasan, A. Bell, L. Geng, R. Liu, M. Stevens, J. Cai, H. Omiya, H. Marui, and S. Tanaka, "Microstructure and electronic properties of InGaN alloys," Phys. Status Solidi B 240, 273-284 (2003). (Pubitemid 37469681)
-
(2003)
Physica Status Solidi (B) Basic Research
, vol.240
, Issue.2
, pp. 273-284
-
-
Ponce, F.A.1
Srinivasan, S.2
Bell, A.3
Geng, L.4
Liu, R.5
Stevens, M.6
Cai, J.7
Omiya, H.8
Marui, H.9
Tanaka, S.10
-
33
-
-
0028367822
-
Light scattering from multilayer optics. I. Tools of investigation
-
C. Amra, "Light scattering from multilayer optics. I. Tools of investigation," J. Opt. Soc. Am. A 11, 197-210 (1994).
-
(1994)
J. Opt. Soc. Am. A
, vol.11
, pp. 197-210
-
-
Amra, C.1
-
34
-
-
0028368291
-
Light scattering from multilayer optics. II. Application to experiment
-
C. Amra, "Light scattering from multilayer optics. II. Application to experiment," J. Opt. Soc. Am. A 11, 211-226 (1994).
-
(1994)
J. Opt. Soc. Am. A
, vol.11
, pp. 211-226
-
-
Amra, C.1
-
35
-
-
0020834662
-
RELATIONSHIP OF THE TOTAL INTEGRATED SCATTERING FROM MULTILAYER-COATED OPTICS TO ANGLE OF INCIDENCE, POLARIZATION, CORRELATION LENGTH, AND ROUGHNESS CROSS-CORRELATION PROPERTIES.
-
J. M. Elson, J. P. Rahn, and J. M. Bennett, "Relationship of the total integrated scattering from multilayer-coated optics to angle of incidence, polarization, correlation length, and roughness cross-correlation properties," Appl. Opt. 22, 3207-3219 (1983). (Pubitemid 14469312)
-
(1983)
Applied Optics
, vol.22
, Issue.20
, pp. 3207-3219
-
-
Elson, J.M.1
Rahn, J.P.2
Bennett, J.M.3
-
36
-
-
0027685097
-
Relation between light scattering and the microstructure of optical thin films
-
A. Duparré and S. Kassam, "Relation between light scattering and the microstructure of optical thin films," Appl. Opt. 32, 5475-5480 (1993).
-
(1993)
Appl. Opt.
, vol.32
, pp. 5475-5480
-
-
Duparré, A.1
Kassam, S.2
-
37
-
-
0027677462
-
Multiwavelength (0:45-10:6 μm) angle-resolved scatterometer or how to extend the optical window
-
C. Amra, D. Torricini, and P. Roche, "Multiwavelength (0:45-10:6 μm) angle-resolved scatterometer or how to extend the optical window," Appl. Opt. 32, 5462-5474 (1993).
-
(1993)
Appl. Opt.
, vol.32
, pp. 5462-5474
-
-
Amra, C.1
Torricini, D.2
Roche, P.3
-
38
-
-
0010821028
-
Optics and optical instruments. Test methods for radiation scattered by optical components
-
International Organization for Standardization, International Organization for Standardization
-
International Organization for Standardization, "Optics and optical instruments. Test methods for radiation scattered by optical components," ISO 13696 (International Organization for Standardization, 2002).
-
(2002)
ISO 13696
-
-
-
39
-
-
79952794585
-
Determination of laser-induced damage threshold of optical surfaces- part 1: 1-on-1 test
-
International Organization for Standardization, International Organization for Standardization
-
International Organization for Standardization, "Determination of laser-induced damage threshold of optical surfaces- part 1: 1-on-1 test, " ISO 11254-1 (International Organization for Standardization, 2000).
-
(2000)
ISO 11254-1
-
-
-
40
-
-
79751493204
-
Laser induced damage of hafnia coatings as a function of pulse duration in the femtosecond to nanosecond range
-
L. Gallais, B. Mangote, M. Zerrad, M. Commandré, A. Melninkaitis, J. Mirauskas, M. Jeskevic, and V. Sirutkaitis, "Laser induced damage of hafnia coatings as a function of pulse duration in the femtosecond to nanosecond range," Appl. Opt. 50, C178-C187 (2011).
-
(2011)
Appl. Opt.
, vol.50
-
-
Gallais, L.1
Mangote, B.2
Zerrad, M.3
Commandré, M.4
Melninkaitis, A.5
Mirauskas, J.6
Jeskevic, M.7
Sirutkaitis, V.8
-
41
-
-
33745646317
-
Laser-induced defects in fused silica by femtosecond IR irradiation
-
A. Zoubir, C. Rivero, R. Grodsky, K. Richardson, M. Richardson, T. Cardinal, and M. Couzi, "Laser-induced defects in fused silica by femtosecond IR irradiation," Phys. Rev. B 73, 224117 (2006).
-
(2006)
Phys. Rev. B
, vol.73
, pp. 224117
-
-
Zoubir, A.1
Rivero, C.2
Grodsky, R.3
Richardson, K.4
Richardson, M.5
Cardinal, T.6
Couzi, M.7
-
42
-
-
20044385139
-
Scaling laws of femtosecond laser pulse induced breakdown in oxide films
-
M. Mero, J. Liu, W. Rudolph, D. Ristau, and K. Starke, "Scaling laws of femtosecond laser pulse induced breakdown in oxide films," Phys. Rev. B 71, 115109 (2005).
-
(2005)
Phys. Rev. B
, vol.71
, pp. 115109
-
-
Mero, M.1
Liu, J.2
Rudolph, W.3
Ristau, D.4
Starke, K.5
-
43
-
-
0030270174
-
Multiscale roughness in optical multilayers: Atomic force microscopy and light scattering
-
C. Deumié, R. Richier, P. Dumas, and C. Amra, "Multiscale roughness in optical multilayers: atomic force microscopy and light scattering," Appl. Opt. 35, 5583-5594 (1996). (Pubitemid 126627805)
-
(1996)
Applied Optics
, vol.35
, Issue.28
, pp. 5583-5594
-
-
Deumie, C.1
Richier, R.2
Dumas, P.3
Amra, C.4
-
44
-
-
34547528226
-
An alternative scattering method to characterize surface roughness from transparent substrates
-
DOI 10.1364/OE.15.009222
-
M. Zerrad, C. Deumié, M. Lequime, and C. Amra, "An alternative scattering method to characterize surface roughness from transparent substrates," Opt. Express 15, 9222-9231 (2007). (Pubitemid 47179692)
-
(2007)
Optics Express
, vol.15
, Issue.15
, pp. 9222-9231
-
-
Zerrad, M.1
Deumie, C.2
Lequime, M.3
Amra, C.4
-
45
-
-
0001162210
-
The Scherrer formula for x-ray particle size determination
-
A. L. Patterson, "The Scherrer formula for x-ray particle size determination," Phys. Rev. 56, 978-982 (1939).
-
(1939)
Phys. Rev.
, vol.56
, pp. 978-982
-
-
Patterson, A.L.1
-
46
-
-
67749127541
-
Calculations and experimental demonstration of multi-photon absorption governing fs laser-induced damage in titania
-
M. Jupé, L. Jensen, A. Melninkaitis, V. Sirutkaitis, and D. Ristau, "Calculations and experimental demonstration of multi-photon absorption governing fs laser-induced damage in titania," Opt. Express 17, 12269-12278 (2009).
-
(2009)
Opt. Express
, vol.17
, pp. 12269-12278
-
-
Jupé, M.1
Jensen, L.2
Melninkaitis, A.3
Sirutkaitis, V.4
Ristau, D.5
-
47
-
-
77955736212
-
Transient interference implications on the subpicosecond laser damage of multidielectrics
-
L. Gallais, B. Mangote, M. Commandré, A. Melninkaitis, J. Mirauskas, M. Jeskevic, and V. Sirutkaitis, "Transient interference implications on the subpicosecond laser damage of multidielectrics," Appl. Phys. Lett. 97, 051112 (2010).
-
(2010)
Appl. Phys. Lett.
, vol.97
, pp. 051112
-
-
Gallais, L.1
Mangote, B.2
Commandré, M.3
Melninkaitis, A.4
Mirauskas, J.5
Jeskevic, M.6
Sirutkaitis, V.7
|