Applications of mixture oxide materials for fs optics

Optics InfoBase Conference Papers

Volumn , Issue , 2007, Pages

  Jupe, M ^a   Lappschies, M ^a   Jensen, L ^a   Starke, K ^a   Ristau, D ^a  

^a LASER ZENTRUM HANNOVER E V   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

COATINGS; FIBER OPTIC SENSORS; ION BEAMS; LIGHT INTERFERENCE; SPUTTERING;

COATING TECHNOLOGIES; DAMAGE THRESHOLD; DESIGN CONCEPT; ION-BEAM SPUTTERING; OXIDE MATERIALS; THIN-FILM DIELECTRICS;

DIELECTRIC MATERIALS;

EID: 85088719911     PISSN: None     EISSN: 21622701     Source Type: Conference Proceeding    
DOI: 10.1364/oic.2007.tua6     Document Type: Conference Paper

References (8)

1. Lappschies, M.; Görtz, B. & Ristau, D. (2004), 'Application of Optical Broad Band Monitoring to Quasi-Rugate Filters by Ion Beam Sputtering', in 'Optical Interference Coatings', OSA Technical Digest, pp. TuE4.
2. Lappschies, M.; Görtz, B. & Ristau, D. (2005), 'Optical Monitoring of Rugate Filters', Proccedings of SPIE 5963, 59631Z.
3. Jasapara, J.; Nampoothiri, A.V.V.; Rudolph, W.; Ristau, D. & Starke, K. (2001), 'Femtosecond laser pulse induced breakdown in dielectric thin films', Phys. Rev. B 63(4), 045117/1-5.
4. Starke, K.; Ristau, D.; Welling, H.; Amotchkina, T.V.; Trubetskov, M.; Tikhonravov, A.A. & Chirkin, A.S. (2004), 'Investigations in the non-linear behavior of dielectric coatings by using ultrashort pulses', Procceding of SPIE 5273.
5. Starke, K. (2004), 'Uebertragung von Standardmessverfahren zur Charakerisierung optischer Beschichtungen in den Bereich ultra kurzer Laserpulse'., PhD thesis, Universitat Hannover.
6. Jupe, M.; Jensen, L.; Starke, K.; Ristau D. Melninkaitis, A. & Grigonis, R.S.V. (2005), 'Quantized Wavelength Behavior of fs-LIDT in Dielectric Layers', Proc. SPIE 5647, 53-60.
7. Jupé, M., Jensen, L., Lappschies, M., Starke, K. & Ristau, D. (2006), 'Improvement in laser irradiation resistance of fs dielectric optics using Silica mixtures', Proc. SPIE 6403, to be published
8. (2001),'ISO 11254-2: Test methods for laser induced damage threshold of optical surfaces. Part 2: S on 1 test', International Organization for Standardization, Technical Comittee: Optics and Optical Instruments, subcomittee: Lasers and Laser-Related Equipment, International Standard, Genéve, Switzerland, International Organization for Standardization.