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Volumn 40, Issue 13, 2001, Pages 2177-2182

Low-loss dielectric mirror with ion-beam-sputtered TiO2–SiO2 mixed films

Author keywords

[No Author keywords available]

Indexed keywords

ANNEALING; DIELECTRIC MATERIALS; ION BEAMS; LASER DAMAGE; MIRRORS; NUMERICAL METHODS; PHASE TRANSITIONS; REFRACTIVE INDEX; SILICA; SPUTTERING; THERMAL EFFECTS; TITANIUM OXIDES;

EID: 0005783068     PISSN: 1559128X     EISSN: 21553165     Source Type: Journal    
DOI: 10.1364/AO.40.002177     Document Type: Article
Times cited : (75)

References (11)
  • 1
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    • S. Chao, W. L. Lim, and J. A. Hammond, “Lock-in growth in a ring laser gyro,” in Physics of Optical Ring Gyros, S. F. Jacobs, M. Sargent III, M. O. Scully, J. Simpson, V. Sanders, and J. E. Killpatrick, eds., Proc. SPIE 487, 50-57 (1984).
    • (1984) Physics of Optical Ring Gyros , vol.487 , pp. 50-57
    • Chao, S.1    Lim, W.L.2    Hammond, J.A.3
  • 2
    • 85010125571 scopus 로고
    • Los Angeles, Calif
    • Internal Rep. (Northrop Corporation, Los Angeles, Calif., 1984).
    • (1984) (Northrop Corporation
  • 3
    • 84975538355 scopus 로고
    • Measurement of ultralow losses in an optical interferometer
    • G. Rempe, R. J. Thompson, H. J. Kimble, and R. Lalezari, “Measurement of ultralow losses in an optical interferometer,” Opt. Lett. 17, 363-365 (1992).
    • (1992) Opt. Lett. , vol.17 , pp. 363-365
    • Rempe, G.1    Thompson, R.J.2    Kimble, H.J.3    Lalezari, R.4
  • 4
    • 84975572583 scopus 로고
    • Ion beam interference coating for ultralow optics loss
    • D. T. Wei, “Ion beam interference coating for ultralow optics loss,” Appl. Opt. 28, 2813-2816 (1989).
    • (1989) Appl. Opt. , vol.28 , pp. 2813-2816
    • Wei, D.T.1
  • 6
    • 0004359338 scopus 로고    scopus 로고
    • Annealing effect on ion-beam-sputtered titanium dioxide film
    • W.-H. Wang and S. Chao, “Annealing effect on ion-beam-sputtered titanium dioxide film,” Opt. Lett. 23, 1417-1419 (1998).
    • (1998) Opt. Lett. , vol.23 , pp. 1417-1419
    • Wang, W.-H.1    Chao, S.2
  • 7
    • 84975635877 scopus 로고
    • TiO2-SiO2 mixed films prepared by fast alternating sputter method
    • 2 mixed films prepared by fast alternating sputter method,” Appl. Opt. 30, 3233-3238 (1991).
    • (1991) Appl. Opt. , vol.30 , pp. 3233-3238
    • Chao, S.1    Chang, C.-K.2    Chen, J.-S.3
  • 10
    • 85010125005 scopus 로고    scopus 로고
    • Ph.D. dissertation (Electrical Engineering Department, Hsin-Chu, Taiwan
    • W.-H. Wang, Ph.D. dissertation (Electrical Engineering Department, National Tsing Hua University, Hsin-Chu, Taiwan, 1999).
    • (1999) National Tsing Hua University
    • Wang, W.-H.1
  • 11
    • 0004055235 scopus 로고
    • 4th ed. (Saunders, Philadelphia, Pa
    • A. Yariv, Optical Electronics, 4th ed. (Saunders, Philadelphia, Pa., 1991), p. 131.
    • (1991) Optical Electronics , pp. 131
    • Yariv, A.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.