Angle-resolved scattering: An effective method for characterizing thin-film coatings

Applied Optics

Volumn 50, Issue 9, 2011, Pages

  Schröder, Sven ^a   Herffurth, Tobias ^a   Blaschke, Holger ^b   Duparré, Angela ^a  

^a FRAUNHOFER INSTITUTE FOR APPLIED OPTICS AND PRECISION ENGINEERING   (Germany)

^b LASER ZENTRUM HANNOVER E V   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

COATINGS; LIGHT SCATTERING; SURFACE ROUGHNESS; THIN FILMS;

ALTERATION EFFECTS; ANGLE RESOLVED SCATTERING; INVERSE SCATTERING PROBLEMS; LASER INDUCED DEGRADATIONS; LIGHT SCATTERING TECHNIQUES; OPTICAL THICKNESS; ROUGHNESS EVOLUTION; THIN-FILM COATINGS;

INVERSE PROBLEMS;

EID: 79952780520     PISSN: 1559128X     EISSN: 15394522     Source Type: Journal    
DOI: 10.1364/AO.50.00C164     Document Type: Article

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